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Influence Mechanism of Cu Layer Thickness on Photoelectric Properties of IWO/Cu/IWO Films

Transparent conductive IWO/Cu/IWO (W-doped In(2)O(3)) films were deposited on quartz substrates by magnetron sputtering of IWO and Cu in the Ar atmosphere. The X-ray diffraction (XRD) patterns identified the cubic iron–manganese ore crystal structure of the IWO layers. The influence of the thickness...

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Detalles Bibliográficos
Autores principales:	Han, Fengbo, Zhao, Wenyuan, Bi, Ran, Tian, Feng, Li, Yadan, Zheng, Chuantao, Wang, Yiding
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2019
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6982096/ https://www.ncbi.nlm.nih.gov/pubmed/31881786 http://dx.doi.org/10.3390/ma13010113

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