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Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners

Industrial adoption of additive manufacturing (AM) processes demands improvement in the geometrical accuracy of manufactured parts. One key achievement would be to ensure that manufactured layer contours match the correspondent theoretical profiles, which would require integration of on-machine meas...

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Autores principales: Blanco, David, Fernandez, Pedro, Noriega, Alvaro, Alvarez, Braulio J., Valiño, Gonzalo
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2019
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6982839/
https://www.ncbi.nlm.nih.gov/pubmed/31861251
http://dx.doi.org/10.3390/s20010001
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author Blanco, David
Fernandez, Pedro
Noriega, Alvaro
Alvarez, Braulio J.
Valiño, Gonzalo
author_facet Blanco, David
Fernandez, Pedro
Noriega, Alvaro
Alvarez, Braulio J.
Valiño, Gonzalo
author_sort Blanco, David
collection PubMed
description Industrial adoption of additive manufacturing (AM) processes demands improvement in the geometrical accuracy of manufactured parts. One key achievement would be to ensure that manufactured layer contours match the correspondent theoretical profiles, which would require integration of on-machine measurement devices capable of digitizing individual layers. Flatbed scanners should be considered as serious candidates, since they can achieve high scanning speeds at low prices. Nevertheless, image deformation phenomena reduce their suitability as two-dimensional verification devices. In this work, the possibilities of using flatbed scanners for AM contour verification are investigated. Image distortion errors are characterized and discussed and special attention is paid to the plication effect caused by contact imaging sensor (CIS) scanners. To compensate this phenomena, a new local distortion adjustment (LDA) method is proposed and its distortion correction capabilities are evaluated upon actual layer contours manufactured on a fused filament fabrication (FFF) machine. This proposed method is also compared to conventional global distortion adjustment (GDA). Results reveal quasi-systematic deformations of the images which could be minimized by means of distortion correction. Nevertheless, the irregular nature of such a distortion and the superposition of different errors penalize the use of GDA, to the point that it should not be used with CIS scanners. Conclusions indicate that LDA-based correction would enable the use of flatbed scanners in AM for on-machine verification tasks.
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spelling pubmed-69828392020-02-06 Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners Blanco, David Fernandez, Pedro Noriega, Alvaro Alvarez, Braulio J. Valiño, Gonzalo Sensors (Basel) Article Industrial adoption of additive manufacturing (AM) processes demands improvement in the geometrical accuracy of manufactured parts. One key achievement would be to ensure that manufactured layer contours match the correspondent theoretical profiles, which would require integration of on-machine measurement devices capable of digitizing individual layers. Flatbed scanners should be considered as serious candidates, since they can achieve high scanning speeds at low prices. Nevertheless, image deformation phenomena reduce their suitability as two-dimensional verification devices. In this work, the possibilities of using flatbed scanners for AM contour verification are investigated. Image distortion errors are characterized and discussed and special attention is paid to the plication effect caused by contact imaging sensor (CIS) scanners. To compensate this phenomena, a new local distortion adjustment (LDA) method is proposed and its distortion correction capabilities are evaluated upon actual layer contours manufactured on a fused filament fabrication (FFF) machine. This proposed method is also compared to conventional global distortion adjustment (GDA). Results reveal quasi-systematic deformations of the images which could be minimized by means of distortion correction. Nevertheless, the irregular nature of such a distortion and the superposition of different errors penalize the use of GDA, to the point that it should not be used with CIS scanners. Conclusions indicate that LDA-based correction would enable the use of flatbed scanners in AM for on-machine verification tasks. MDPI 2019-12-18 /pmc/articles/PMC6982839/ /pubmed/31861251 http://dx.doi.org/10.3390/s20010001 Text en © 2019 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Blanco, David
Fernandez, Pedro
Noriega, Alvaro
Alvarez, Braulio J.
Valiño, Gonzalo
Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners
title Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners
title_full Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners
title_fullStr Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners
title_full_unstemmed Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners
title_short Layer Contour Verification in Additive Manufacturing by Means of Commercial Flatbed Scanners
title_sort layer contour verification in additive manufacturing by means of commercial flatbed scanners
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6982839/
https://www.ncbi.nlm.nih.gov/pubmed/31861251
http://dx.doi.org/10.3390/s20010001
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