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Radio-frequency optomechanical characterization of a silicon nitride drum

On-chip actuation and readout of mechanical motion is key to characterize mechanical resonators and exploit them for new applications. We capacitively couple a silicon nitride membrane to an off resonant radio-frequency cavity formed by a lumped element circuit. Despite a low cavity quality factor (...

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Autores principales: Pearson, A. N., Khosla, K. E., Mergenthaler, M., Briggs, G. A. D., Laird, E. A., Ares, N.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6997228/
https://www.ncbi.nlm.nih.gov/pubmed/32015416
http://dx.doi.org/10.1038/s41598-020-58554-x
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author Pearson, A. N.
Khosla, K. E.
Mergenthaler, M.
Briggs, G. A. D.
Laird, E. A.
Ares, N.
author_facet Pearson, A. N.
Khosla, K. E.
Mergenthaler, M.
Briggs, G. A. D.
Laird, E. A.
Ares, N.
author_sort Pearson, A. N.
collection PubMed
description On-chip actuation and readout of mechanical motion is key to characterize mechanical resonators and exploit them for new applications. We capacitively couple a silicon nitride membrane to an off resonant radio-frequency cavity formed by a lumped element circuit. Despite a low cavity quality factor (Q(E) ≈ 7.4) and off resonant, room temperature operation, we are able to parametrize several mechanical modes and estimate their optomechanical coupling strengths. This enables real-time measurements of the membrane’s driven motion and fast characterization without requiring a superconducting cavity, thereby eliminating the need for cryogenic cooling. Finally, we observe optomechanically induced transparency and absorption, crucial for a number of applications including sensitive metrology, ground state cooling of mechanical motion and slowing of light.
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spelling pubmed-69972282020-02-10 Radio-frequency optomechanical characterization of a silicon nitride drum Pearson, A. N. Khosla, K. E. Mergenthaler, M. Briggs, G. A. D. Laird, E. A. Ares, N. Sci Rep Article On-chip actuation and readout of mechanical motion is key to characterize mechanical resonators and exploit them for new applications. We capacitively couple a silicon nitride membrane to an off resonant radio-frequency cavity formed by a lumped element circuit. Despite a low cavity quality factor (Q(E) ≈ 7.4) and off resonant, room temperature operation, we are able to parametrize several mechanical modes and estimate their optomechanical coupling strengths. This enables real-time measurements of the membrane’s driven motion and fast characterization without requiring a superconducting cavity, thereby eliminating the need for cryogenic cooling. Finally, we observe optomechanically induced transparency and absorption, crucial for a number of applications including sensitive metrology, ground state cooling of mechanical motion and slowing of light. Nature Publishing Group UK 2020-02-03 /pmc/articles/PMC6997228/ /pubmed/32015416 http://dx.doi.org/10.1038/s41598-020-58554-x Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Pearson, A. N.
Khosla, K. E.
Mergenthaler, M.
Briggs, G. A. D.
Laird, E. A.
Ares, N.
Radio-frequency optomechanical characterization of a silicon nitride drum
title Radio-frequency optomechanical characterization of a silicon nitride drum
title_full Radio-frequency optomechanical characterization of a silicon nitride drum
title_fullStr Radio-frequency optomechanical characterization of a silicon nitride drum
title_full_unstemmed Radio-frequency optomechanical characterization of a silicon nitride drum
title_short Radio-frequency optomechanical characterization of a silicon nitride drum
title_sort radio-frequency optomechanical characterization of a silicon nitride drum
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC6997228/
https://www.ncbi.nlm.nih.gov/pubmed/32015416
http://dx.doi.org/10.1038/s41598-020-58554-x
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