Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering

The datasets in this article are supplementary to the corresponding research article [1, 2]. The planar morphology and topography of TiC thin films coated on commercially pure Titanium (CpTi) grown by RF magnetron sputtering were investigated using Field emission scanning electron microscope (FESEM)...

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Autores principales: Abegunde, Olayinka Oluwatosin, Akinlabi, Esther Titilayo, Oladijo, Philip Oluseyi
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Elsevier 2020
Materias:
Engineering
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005493/
https://www.ncbi.nlm.nih.gov/pubmed/32055672
http://dx.doi.org/10.1016/j.dib.2020.105205
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author Abegunde, Olayinka Oluwatosin
Akinlabi, Esther Titilayo
Oladijo, Philip Oluseyi
author_facet Abegunde, Olayinka Oluwatosin
Akinlabi, Esther Titilayo
Oladijo, Philip Oluseyi
author_sort Abegunde, Olayinka Oluwatosin
collection PubMed
description The datasets in this article are supplementary to the corresponding research article [1, 2]. The planar morphology and topography of TiC thin films coated on commercially pure Titanium (CpTi) grown by RF magnetron sputtering were investigated using Field emission scanning electron microscope (FESEM) and Atomic force microscope (AFM). The mechanical properties such as Hardness and Young Modulus of the thin film coating was studied using Nanohardness. Furthermore, grazing incidence X-ray diffractometer (GIXRD) and Raman spectroscopy were used to analyse the structural and composition of the TiC thin film coating.
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spelling pubmed-70054932020-02-13 Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering Abegunde, Olayinka Oluwatosin Akinlabi, Esther Titilayo Oladijo, Philip Oluseyi Data Brief Engineering The datasets in this article are supplementary to the corresponding research article [1, 2]. The planar morphology and topography of TiC thin films coated on commercially pure Titanium (CpTi) grown by RF magnetron sputtering were investigated using Field emission scanning electron microscope (FESEM) and Atomic force microscope (AFM). The mechanical properties such as Hardness and Young Modulus of the thin film coating was studied using Nanohardness. Furthermore, grazing incidence X-ray diffractometer (GIXRD) and Raman spectroscopy were used to analyse the structural and composition of the TiC thin film coating. Elsevier 2020-01-25 /pmc/articles/PMC7005493/ /pubmed/32055672 http://dx.doi.org/10.1016/j.dib.2020.105205 Text en © 2020 The Authors http://creativecommons.org/licenses/by/4.0/ This is an open access article under the CC BY license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Engineering
Abegunde, Olayinka Oluwatosin
Akinlabi, Esther Titilayo
Oladijo, Philip Oluseyi
Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering
title Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering
title_full Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering
title_fullStr Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering
title_full_unstemmed Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering
title_short Dataset on microstructural, structural and tribology characterization of TiC thin film on CpTi substrate grown by RF magnetron sputtering
title_sort dataset on microstructural, structural and tribology characterization of tic thin film on cpti substrate grown by rf magnetron sputtering
topic Engineering
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005493/
https://www.ncbi.nlm.nih.gov/pubmed/32055672
http://dx.doi.org/10.1016/j.dib.2020.105205
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