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An interactive ImageJ plugin for semi-automated image denoising in electron microscopy

The recent advent of 3D in electron microscopy (EM) has allowed for detection of nanometer resolution structures. This has caused an explosion in dataset size, necessitating the development of automated workflows. Moreover, large 3D EM datasets typically require hours to days to be acquired and acce...

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Autores principales: Roels, Joris, Vernaillen, Frank, Kremer, Anna, Gonçalves, Amanda, Aelterman, Jan, Luong, Hiêp Q., Goossens, Bart, Philips, Wilfried, Lippens, Saskia, Saeys, Yvan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005902/
https://www.ncbi.nlm.nih.gov/pubmed/32034132
http://dx.doi.org/10.1038/s41467-020-14529-0
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author Roels, Joris
Vernaillen, Frank
Kremer, Anna
Gonçalves, Amanda
Aelterman, Jan
Luong, Hiêp Q.
Goossens, Bart
Philips, Wilfried
Lippens, Saskia
Saeys, Yvan
author_facet Roels, Joris
Vernaillen, Frank
Kremer, Anna
Gonçalves, Amanda
Aelterman, Jan
Luong, Hiêp Q.
Goossens, Bart
Philips, Wilfried
Lippens, Saskia
Saeys, Yvan
author_sort Roels, Joris
collection PubMed
description The recent advent of 3D in electron microscopy (EM) has allowed for detection of nanometer resolution structures. This has caused an explosion in dataset size, necessitating the development of automated workflows. Moreover, large 3D EM datasets typically require hours to days to be acquired and accelerated imaging typically results in noisy data. Advanced denoising techniques can alleviate this, but tend to be less accessible to the community due to low-level programming environments, complex parameter tuning or a computational bottleneck. We present DenoisEM: an interactive and GPU accelerated denoising plugin for ImageJ that ensures fast parameter tuning and processing through parallel computing. Experimental results show that DenoisEM is one order of magnitude faster than related software and can accelerate data acquisition by a factor of 4 without significantly affecting data quality. Lastly, we show that image denoising benefits visualization and (semi-)automated segmentation and analysis of ultrastructure in various volume EM datasets.
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spelling pubmed-70059022020-02-10 An interactive ImageJ plugin for semi-automated image denoising in electron microscopy Roels, Joris Vernaillen, Frank Kremer, Anna Gonçalves, Amanda Aelterman, Jan Luong, Hiêp Q. Goossens, Bart Philips, Wilfried Lippens, Saskia Saeys, Yvan Nat Commun Article The recent advent of 3D in electron microscopy (EM) has allowed for detection of nanometer resolution structures. This has caused an explosion in dataset size, necessitating the development of automated workflows. Moreover, large 3D EM datasets typically require hours to days to be acquired and accelerated imaging typically results in noisy data. Advanced denoising techniques can alleviate this, but tend to be less accessible to the community due to low-level programming environments, complex parameter tuning or a computational bottleneck. We present DenoisEM: an interactive and GPU accelerated denoising plugin for ImageJ that ensures fast parameter tuning and processing through parallel computing. Experimental results show that DenoisEM is one order of magnitude faster than related software and can accelerate data acquisition by a factor of 4 without significantly affecting data quality. Lastly, we show that image denoising benefits visualization and (semi-)automated segmentation and analysis of ultrastructure in various volume EM datasets. Nature Publishing Group UK 2020-02-07 /pmc/articles/PMC7005902/ /pubmed/32034132 http://dx.doi.org/10.1038/s41467-020-14529-0 Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Roels, Joris
Vernaillen, Frank
Kremer, Anna
Gonçalves, Amanda
Aelterman, Jan
Luong, Hiêp Q.
Goossens, Bart
Philips, Wilfried
Lippens, Saskia
Saeys, Yvan
An interactive ImageJ plugin for semi-automated image denoising in electron microscopy
title An interactive ImageJ plugin for semi-automated image denoising in electron microscopy
title_full An interactive ImageJ plugin for semi-automated image denoising in electron microscopy
title_fullStr An interactive ImageJ plugin for semi-automated image denoising in electron microscopy
title_full_unstemmed An interactive ImageJ plugin for semi-automated image denoising in electron microscopy
title_short An interactive ImageJ plugin for semi-automated image denoising in electron microscopy
title_sort interactive imagej plugin for semi-automated image denoising in electron microscopy
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005902/
https://www.ncbi.nlm.nih.gov/pubmed/32034132
http://dx.doi.org/10.1038/s41467-020-14529-0
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