An interactive ImageJ plugin for semi-automated image denoising in electron microscopy

The recent advent of 3D in electron microscopy (EM) has allowed for detection of nanometer resolution structures. This has caused an explosion in dataset size, necessitating the development of automated workflows. Moreover, large 3D EM datasets typically require hours to days to be acquired and acce...

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Detalles Bibliográficos
Autores principales: Roels, Joris, Vernaillen, Frank, Kremer, Anna, Gonçalves, Amanda, Aelterman, Jan, Luong, Hiêp Q., Goossens, Bart, Philips, Wilfried, Lippens, Saskia, Saeys, Yvan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005902/
https://www.ncbi.nlm.nih.gov/pubmed/32034132
http://dx.doi.org/10.1038/s41467-020-14529-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005902/
https://www.ncbi.nlm.nih.gov/pubmed/32034132
http://dx.doi.org/10.1038/s41467-020-14529-0

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