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An interactive ImageJ plugin for semi-automated image denoising in electron microscopy
The recent advent of 3D in electron microscopy (EM) has allowed for detection of nanometer resolution structures. This has caused an explosion in dataset size, necessitating the development of automated workflows. Moreover, large 3D EM datasets typically require hours to days to be acquired and acce...
| Autores principales: | , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Nature Publishing Group UK
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7005902/ https://www.ncbi.nlm.nih.gov/pubmed/32034132 http://dx.doi.org/10.1038/s41467-020-14529-0 |