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Comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: An in vivo study

AIM: This study aims to evaluate and compare the crestal bone levels around implants as influenced by conventional and diode laser during second-stage surgery in an edentulous mandible using cone beam computed tomography (CBCT) and digital radiography (DR). SETTINGS AND DESIGN: A split-mouth in vivo...

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Autores principales: Bajaj, Sushant, Rani, Sapna, Issar, Gaurav, Sethi, Upasana, Kumar, Shalabh, Mishra, Sarvesh
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Wolters Kluwer - Medknow 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7008621/
https://www.ncbi.nlm.nih.gov/pubmed/32089599
http://dx.doi.org/10.4103/jips.jips_55_19
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author Bajaj, Sushant
Rani, Sapna
Issar, Gaurav
Sethi, Upasana
Kumar, Shalabh
Mishra, Sarvesh
author_facet Bajaj, Sushant
Rani, Sapna
Issar, Gaurav
Sethi, Upasana
Kumar, Shalabh
Mishra, Sarvesh
author_sort Bajaj, Sushant
collection PubMed
description AIM: This study aims to evaluate and compare the crestal bone levels around implants as influenced by conventional and diode laser during second-stage surgery in an edentulous mandible using cone beam computed tomography (CBCT) and digital radiography (DR). SETTINGS AND DESIGN: A split-mouth in vivo prospective study on edentulous patients involving placement of two implants in mandible followed by the comparison of two different techniques for second-stage surgery. MATERIALS AND METHODS: The study was undertaken to evaluate the crestal bone change around 16 implant sites distributed in two groups (eight implants each) following two methods during second-stage surgery, i.e., Group 1 - Conventional second stage and Group 2 - Diode laser. Measurements were made on two sides (mesial and distal) using intraoral periapical and four sides (labial, lingual, mesial, and distal) using CBCT scans for both groups. These measurements were conducted at two time intervals for both, i.e., immediately after implant loading and twenty 4 weeks after implant loading. The values obtained were subjected to statistical analysis. STATISTICAL ANALYSIS USED: The normality of data was checked by Shapiro–Wilk's test. Intragroup comparison was compared using independent t-test by post hoc comparison by Bonferroni method (P < 0.05). RESULTS: Crestal bone loss at the time of loading for Group 1 evaluated by CBCT was 0.950 ± 0.988 while after 24 weeks of loading, it was 1.388 ± 0.576. For Group 2, mean crestal bone loss was 1.200 ± 0.925 at the time of loading, and after 24 weeks, it was 1.512 ± 0.674. Crestal bone loss at the time of loading for Group 1 evaluated by DR was 1.075 ± 0.849 while after 24 weeks of loading, it was 1.562 ± 0.480. For Group 2, mean crestal bone loss was 1.162 ± 0.833 at the time of loading and after 24 weeks, it was 1.700 ± 0.498. CONCLUSIONS: In the present study, no statistically significant difference was observed in crestal bone loss between conventional and diode laser technique.
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spelling pubmed-70086212021-01-01 Comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: An in vivo study Bajaj, Sushant Rani, Sapna Issar, Gaurav Sethi, Upasana Kumar, Shalabh Mishra, Sarvesh J Indian Prosthodont Soc Original Article AIM: This study aims to evaluate and compare the crestal bone levels around implants as influenced by conventional and diode laser during second-stage surgery in an edentulous mandible using cone beam computed tomography (CBCT) and digital radiography (DR). SETTINGS AND DESIGN: A split-mouth in vivo prospective study on edentulous patients involving placement of two implants in mandible followed by the comparison of two different techniques for second-stage surgery. MATERIALS AND METHODS: The study was undertaken to evaluate the crestal bone change around 16 implant sites distributed in two groups (eight implants each) following two methods during second-stage surgery, i.e., Group 1 - Conventional second stage and Group 2 - Diode laser. Measurements were made on two sides (mesial and distal) using intraoral periapical and four sides (labial, lingual, mesial, and distal) using CBCT scans for both groups. These measurements were conducted at two time intervals for both, i.e., immediately after implant loading and twenty 4 weeks after implant loading. The values obtained were subjected to statistical analysis. STATISTICAL ANALYSIS USED: The normality of data was checked by Shapiro–Wilk's test. Intragroup comparison was compared using independent t-test by post hoc comparison by Bonferroni method (P < 0.05). RESULTS: Crestal bone loss at the time of loading for Group 1 evaluated by CBCT was 0.950 ± 0.988 while after 24 weeks of loading, it was 1.388 ± 0.576. For Group 2, mean crestal bone loss was 1.200 ± 0.925 at the time of loading, and after 24 weeks, it was 1.512 ± 0.674. Crestal bone loss at the time of loading for Group 1 evaluated by DR was 1.075 ± 0.849 while after 24 weeks of loading, it was 1.562 ± 0.480. For Group 2, mean crestal bone loss was 1.162 ± 0.833 at the time of loading and after 24 weeks, it was 1.700 ± 0.498. CONCLUSIONS: In the present study, no statistically significant difference was observed in crestal bone loss between conventional and diode laser technique. Wolters Kluwer - Medknow 2020 2020-01-27 /pmc/articles/PMC7008621/ /pubmed/32089599 http://dx.doi.org/10.4103/jips.jips_55_19 Text en Copyright: © 2020 The Journal of Indian Prosthodontic Society http://creativecommons.org/licenses/by-nc-sa/4.0 This is an open access journal, and articles are distributed under the terms of the Creative Commons Attribution-NonCommercial-ShareAlike 4.0 License, which allows others to remix, tweak, and build upon the work non-commercially, as long as appropriate credit is given and the new creations are licensed under the identical terms.
spellingShingle Original Article
Bajaj, Sushant
Rani, Sapna
Issar, Gaurav
Sethi, Upasana
Kumar, Shalabh
Mishra, Sarvesh
Comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: An in vivo study
title Comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: An in vivo study
title_full Comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: An in vivo study
title_fullStr Comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: An in vivo study
title_full_unstemmed Comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: An in vivo study
title_short Comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: An in vivo study
title_sort comparative evaluation of crestal bone levels around endosseous implants as influenced by conventional and diode laser during second-stage surgery in mandibular implant-supported overdenture: an in vivo study
topic Original Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7008621/
https://www.ncbi.nlm.nih.gov/pubmed/32089599
http://dx.doi.org/10.4103/jips.jips_55_19
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