Evidence of Stress Development as a Source of Driving Force for Grain-Boundary Migration in a Ni Bicrystalline TEM Specimen

In a previous study, using high-resolution transmission electron microscopy (HRTEM), we examined grain-boundary migration behavior in a Ni bicrystal. A specimen for transmission electron microscopy (TEM) was prepared using focused ion beam. The Ni lamella in the specimen was composed of two grains w...

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Detalles Bibliográficos
Autores principales: Lee, Sung Bo, Jung, Jinwook, Han, Heung Nam
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7013623/
https://www.ncbi.nlm.nih.gov/pubmed/31940950
http://dx.doi.org/10.3390/ma13020360

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