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In-Situ Electron Channeling Contrast Imaging under Tensile Loading: Residual Stress, Dislocation Motion, and Slip Line Formation
Elastoplastic phenomena, such as plastic deformation and failure, are multi-scale, deformation-path-dependent, and mechanical-field-sensitive problems associated with metals. Accordingly, visualization of the microstructural deformation path under a specific mechanical field is challenging for the e...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7021723/ https://www.ncbi.nlm.nih.gov/pubmed/32060322 http://dx.doi.org/10.1038/s41598-020-59429-x |
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author | Nakafuji, Keiichiro Koyama, Motomichi Tsuzaki, Kaneaki |
author_facet | Nakafuji, Keiichiro Koyama, Motomichi Tsuzaki, Kaneaki |
author_sort | Nakafuji, Keiichiro |
collection | PubMed |
description | Elastoplastic phenomena, such as plastic deformation and failure, are multi-scale, deformation-path-dependent, and mechanical-field-sensitive problems associated with metals. Accordingly, visualization of the microstructural deformation path under a specific mechanical field is challenging for the elucidation of elastoplastic phenomena mechanisms. To overcome this problem, a dislocation-resolved in-situ technique for deformation under mechanically controllable conditions is required. Thus, we attempted to apply electron channeling contrast imaging (ECCI) under tensile loading, which enabled the detection of lattice defect motions and the evolution of elastic strain fields in bulk specimens. Here, we presented the suitability of ECCI as an in-situ technique with dislocation-detectable spatial resolution. In particular, the following ECCI-visualized plasticity-related phenomena were observed: (1) pre-deformation-induced residual stress and its disappearance via subsequent reloading, (2) heterogeneous dislocation motion during plastic relaxation, and (3) planar surface relief formation via loading to a higher stress. |
format | Online Article Text |
id | pubmed-7021723 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-70217232020-02-24 In-Situ Electron Channeling Contrast Imaging under Tensile Loading: Residual Stress, Dislocation Motion, and Slip Line Formation Nakafuji, Keiichiro Koyama, Motomichi Tsuzaki, Kaneaki Sci Rep Article Elastoplastic phenomena, such as plastic deformation and failure, are multi-scale, deformation-path-dependent, and mechanical-field-sensitive problems associated with metals. Accordingly, visualization of the microstructural deformation path under a specific mechanical field is challenging for the elucidation of elastoplastic phenomena mechanisms. To overcome this problem, a dislocation-resolved in-situ technique for deformation under mechanically controllable conditions is required. Thus, we attempted to apply electron channeling contrast imaging (ECCI) under tensile loading, which enabled the detection of lattice defect motions and the evolution of elastic strain fields in bulk specimens. Here, we presented the suitability of ECCI as an in-situ technique with dislocation-detectable spatial resolution. In particular, the following ECCI-visualized plasticity-related phenomena were observed: (1) pre-deformation-induced residual stress and its disappearance via subsequent reloading, (2) heterogeneous dislocation motion during plastic relaxation, and (3) planar surface relief formation via loading to a higher stress. Nature Publishing Group UK 2020-02-14 /pmc/articles/PMC7021723/ /pubmed/32060322 http://dx.doi.org/10.1038/s41598-020-59429-x Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Nakafuji, Keiichiro Koyama, Motomichi Tsuzaki, Kaneaki In-Situ Electron Channeling Contrast Imaging under Tensile Loading: Residual Stress, Dislocation Motion, and Slip Line Formation |
title | In-Situ Electron Channeling Contrast Imaging under Tensile Loading: Residual Stress, Dislocation Motion, and Slip Line Formation |
title_full | In-Situ Electron Channeling Contrast Imaging under Tensile Loading: Residual Stress, Dislocation Motion, and Slip Line Formation |
title_fullStr | In-Situ Electron Channeling Contrast Imaging under Tensile Loading: Residual Stress, Dislocation Motion, and Slip Line Formation |
title_full_unstemmed | In-Situ Electron Channeling Contrast Imaging under Tensile Loading: Residual Stress, Dislocation Motion, and Slip Line Formation |
title_short | In-Situ Electron Channeling Contrast Imaging under Tensile Loading: Residual Stress, Dislocation Motion, and Slip Line Formation |
title_sort | in-situ electron channeling contrast imaging under tensile loading: residual stress, dislocation motion, and slip line formation |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7021723/ https://www.ncbi.nlm.nih.gov/pubmed/32060322 http://dx.doi.org/10.1038/s41598-020-59429-x |
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