Application of Electrochemical Atomic Force Microscopy (EC-AFM) in the Corrosion Study of Metallic Materials

Electrochemical atomic force microscopy (EC-AFM), a branch of a scanning probe microscopy (SPM), can image substrate topography with high resolution. Since its inception, it was extended to a wide range of research areas through continuous improvement. The presence of an electrolytic cell and a pote...

Descripción completa

Detalles Bibliográficos
Autores principales: Chen, Hanbing, Qin, Zhenbo, He, Meifeng, Liu, Yichun, Wu, Zhong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7041398/
https://www.ncbi.nlm.nih.gov/pubmed/32028601
http://dx.doi.org/10.3390/ma13030668

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7041398/
https://www.ncbi.nlm.nih.gov/pubmed/32028601
http://dx.doi.org/10.3390/ma13030668

Ejemplares similares