Rapid Recognition of Field-Grown Wheat Spikes Based on a Superpixel Segmentation Algorithm Using Digital Images

Wheat spike number, which could be rapidly and accurately estimated by the image processing technology, serves as the basis for crop growth monitoring and yield prediction. In this research, simple linear iterative clustering (SLIC) was performed for superpixel segmentation of the digital images of...

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Detalles Bibliográficos
Autores principales: Tan, Changwei, Zhang, Pengpeng, Zhang, Yongjiang, Zhou, Xinxing, Wang, Zhixiang, Du, Ying, Mao, Wei, Li, Wenxi, Wang, Dunliang, Guo, Wenshan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Frontiers Media S.A. 2020
Materias:
Plant Science
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7069027/
https://www.ncbi.nlm.nih.gov/pubmed/32211011
http://dx.doi.org/10.3389/fpls.2020.00259

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7069027/
https://www.ncbi.nlm.nih.gov/pubmed/32211011
http://dx.doi.org/10.3389/fpls.2020.00259

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