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Rapid Recognition of Field-Grown Wheat Spikes Based on a Superpixel Segmentation Algorithm Using Digital Images
Wheat spike number, which could be rapidly and accurately estimated by the image processing technology, serves as the basis for crop growth monitoring and yield prediction. In this research, simple linear iterative clustering (SLIC) was performed for superpixel segmentation of the digital images of...
| Autores principales: | , , , , , , , , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Frontiers Media S.A.
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7069027/ https://www.ncbi.nlm.nih.gov/pubmed/32211011 http://dx.doi.org/10.3389/fpls.2020.00259 |