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Genomic Prediction for Grain Yield and Yield-Related Traits in Chinese Winter Wheat
Genomic selection (GS) is a strategy to predict the genetic merits of individuals using genome-wide markers. However, GS prediction accuracy is affected by many factors, including missing rate and minor allele frequency (MAF) of genotypic data, GS models, trait features, etc. In this study, we used...
Autores principales: | , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7073225/ https://www.ncbi.nlm.nih.gov/pubmed/32079240 http://dx.doi.org/10.3390/ijms21041342 |
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author | Ali, Mohsin Zhang, Yong Rasheed, Awais Wang, Jiankang Zhang, Luyan |
author_facet | Ali, Mohsin Zhang, Yong Rasheed, Awais Wang, Jiankang Zhang, Luyan |
author_sort | Ali, Mohsin |
collection | PubMed |
description | Genomic selection (GS) is a strategy to predict the genetic merits of individuals using genome-wide markers. However, GS prediction accuracy is affected by many factors, including missing rate and minor allele frequency (MAF) of genotypic data, GS models, trait features, etc. In this study, we used one wheat population to investigate prediction accuracies of various GS models on yield and yield-related traits from various quality control (QC) scenarios, missing genotype imputation, and genome-wide association studies (GWAS)-derived markers. Missing rate and MAF of single nucleotide polymorphism (SNP) markers were two major factors in QC. Five missing rate levels (0%, 20%, 40%, 60%, and 80%) and three MAF levels (0%, 5%, and 10%) were considered and the five-fold cross validation was used to estimate the prediction accuracy. The results indicated that a moderate missing rate level (20% to 40%) and MAF (5%) threshold provided better prediction accuracy. Under this QC scenario, prediction accuracies were further calculated for imputed and GWAS-derived markers. It was observed that the accuracies of the six traits were related to their heritability and genetic architecture, as well as the GS prediction model. Moore–Penrose generalized inverse (GenInv), ridge regression (RidgeReg), and random forest (RForest) resulted in higher prediction accuracies than other GS models across traits. Imputation of missing genotypic data had marginal effect on prediction accuracy, while GWAS-derived markers improved the prediction accuracy in most cases. These results demonstrate that QC on missing rate and MAF had positive impact on the predictability of GS models. We failed to identify one single combination of QC scenarios that could outperform the others for all traits and GS models. However, the balance between marker number and marker quality is important for the deployment of GS in wheat breeding. GWAS is able to select markers which are mostly related to traits, and therefore can be used to improve the prediction accuracy of GS. |
format | Online Article Text |
id | pubmed-7073225 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-70732252020-03-19 Genomic Prediction for Grain Yield and Yield-Related Traits in Chinese Winter Wheat Ali, Mohsin Zhang, Yong Rasheed, Awais Wang, Jiankang Zhang, Luyan Int J Mol Sci Article Genomic selection (GS) is a strategy to predict the genetic merits of individuals using genome-wide markers. However, GS prediction accuracy is affected by many factors, including missing rate and minor allele frequency (MAF) of genotypic data, GS models, trait features, etc. In this study, we used one wheat population to investigate prediction accuracies of various GS models on yield and yield-related traits from various quality control (QC) scenarios, missing genotype imputation, and genome-wide association studies (GWAS)-derived markers. Missing rate and MAF of single nucleotide polymorphism (SNP) markers were two major factors in QC. Five missing rate levels (0%, 20%, 40%, 60%, and 80%) and three MAF levels (0%, 5%, and 10%) were considered and the five-fold cross validation was used to estimate the prediction accuracy. The results indicated that a moderate missing rate level (20% to 40%) and MAF (5%) threshold provided better prediction accuracy. Under this QC scenario, prediction accuracies were further calculated for imputed and GWAS-derived markers. It was observed that the accuracies of the six traits were related to their heritability and genetic architecture, as well as the GS prediction model. Moore–Penrose generalized inverse (GenInv), ridge regression (RidgeReg), and random forest (RForest) resulted in higher prediction accuracies than other GS models across traits. Imputation of missing genotypic data had marginal effect on prediction accuracy, while GWAS-derived markers improved the prediction accuracy in most cases. These results demonstrate that QC on missing rate and MAF had positive impact on the predictability of GS models. We failed to identify one single combination of QC scenarios that could outperform the others for all traits and GS models. However, the balance between marker number and marker quality is important for the deployment of GS in wheat breeding. GWAS is able to select markers which are mostly related to traits, and therefore can be used to improve the prediction accuracy of GS. MDPI 2020-02-17 /pmc/articles/PMC7073225/ /pubmed/32079240 http://dx.doi.org/10.3390/ijms21041342 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Ali, Mohsin Zhang, Yong Rasheed, Awais Wang, Jiankang Zhang, Luyan Genomic Prediction for Grain Yield and Yield-Related Traits in Chinese Winter Wheat |
title | Genomic Prediction for Grain Yield and Yield-Related Traits in Chinese Winter Wheat |
title_full | Genomic Prediction for Grain Yield and Yield-Related Traits in Chinese Winter Wheat |
title_fullStr | Genomic Prediction for Grain Yield and Yield-Related Traits in Chinese Winter Wheat |
title_full_unstemmed | Genomic Prediction for Grain Yield and Yield-Related Traits in Chinese Winter Wheat |
title_short | Genomic Prediction for Grain Yield and Yield-Related Traits in Chinese Winter Wheat |
title_sort | genomic prediction for grain yield and yield-related traits in chinese winter wheat |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7073225/ https://www.ncbi.nlm.nih.gov/pubmed/32079240 http://dx.doi.org/10.3390/ijms21041342 |
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