Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799

Detalles Bibliográficos
Autores principales: De Teresa, José María, Orús, Pablo, Córdoba, Rosa, Philipp, Patrick
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Erratum
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7074676/
https://www.ncbi.nlm.nih.gov/pubmed/32085657
http://dx.doi.org/10.3390/mi11020211
_version_ 1783506887903281152
author De Teresa, José María
Orús, Pablo
Córdoba, Rosa
Philipp, Patrick
author_facet De Teresa, José María
Orús, Pablo
Córdoba, Rosa
Philipp, Patrick
author_sort De Teresa, José María
collection PubMed
description
format Online
Article
Text
id pubmed-7074676
institution National Center for Biotechnology Information
language English
publishDate 2020
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-70746762020-03-20 Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799 De Teresa, José María Orús, Pablo Córdoba, Rosa Philipp, Patrick Micromachines (Basel) Erratum MDPI 2020-02-18 /pmc/articles/PMC7074676/ /pubmed/32085657 http://dx.doi.org/10.3390/mi11020211 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Erratum
De Teresa, José María
Orús, Pablo
Córdoba, Rosa
Philipp, Patrick
Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
title Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
title_full Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
title_fullStr Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
title_full_unstemmed Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
title_short Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
title_sort erratum: de teresa, j.m. et al. comparison between focused electron/ion beam-induced deposition at room temperature and under cryogenic conditions. micromachines 2019, 10, 799
topic Erratum
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7074676/
https://www.ncbi.nlm.nih.gov/pubmed/32085657
http://dx.doi.org/10.3390/mi11020211
work_keys_str_mv AT deteresajosemaria erratumdeteresajmetalcomparisonbetweenfocusedelectronionbeaminduceddepositionatroomtemperatureandundercryogenicconditionsmicromachines201910799
AT oruspablo erratumdeteresajmetalcomparisonbetweenfocusedelectronionbeaminduceddepositionatroomtemperatureandundercryogenicconditionsmicromachines201910799
AT cordobarosa erratumdeteresajmetalcomparisonbetweenfocusedelectronionbeaminduceddepositionatroomtemperatureandundercryogenicconditionsmicromachines201910799
AT philipppatrick erratumdeteresajmetalcomparisonbetweenfocusedelectronionbeaminduceddepositionatroomtemperatureandundercryogenicconditionsmicromachines201910799

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