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Erratum: De Teresa, J.M. et al. Comparison between Focused Electron/Ion Beam-Induced Deposition at Room Temperature and under Cryogenic Conditions. Micromachines 2019, 10, 799
Autores principales: | De Teresa, José María, Orús, Pablo, Córdoba, Rosa, Philipp, Patrick |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7074676/ https://www.ncbi.nlm.nih.gov/pubmed/32085657 http://dx.doi.org/10.3390/mi11020211 |
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