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Nanoscale Estimation of Coating Thickness on Substrates via Standardless BSE Detector Calibration
The thickness of electron transparent samples can be measured in an electron microscope using several imaging techniques like electron energy loss spectroscopy (EELS) or quantitative scanning transmission electron microscopy (STEM). We extrapolate this method for using a back-scattered electron (BSE...
Autores principales: | Skoupy, Radim, Fort, Tomas, Krzyzanek, Vladislav |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7075161/ https://www.ncbi.nlm.nih.gov/pubmed/32075242 http://dx.doi.org/10.3390/nano10020332 |
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