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Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions
Electric-field-induced changes of the orientational structures of cholesteric liquid crystal layer with the tangential-conical boundary conditions have been investigated. The samples with the ratio of the cholesteric layer thickness d to the helix pitch p equalled to 0.57 have been considered. The p...
Autores principales: | , , , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7078221/ https://www.ncbi.nlm.nih.gov/pubmed/32184447 http://dx.doi.org/10.1038/s41598-020-61713-9 |
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author | Krakhalev, Mikhail N. Prishchepa, Oxana O. Sutormin, Vitaly S. Bikbaev, Rashid G. Timofeev, Ivan V. Zyryanov, Victor Ya. |
author_facet | Krakhalev, Mikhail N. Prishchepa, Oxana O. Sutormin, Vitaly S. Bikbaev, Rashid G. Timofeev, Ivan V. Zyryanov, Victor Ya. |
author_sort | Krakhalev, Mikhail N. |
collection | PubMed |
description | Electric-field-induced changes of the orientational structures of cholesteric liquid crystal layer with the tangential-conical boundary conditions have been investigated. The samples with the ratio of the cholesteric layer thickness d to the helix pitch p equalled to 0.57 have been considered. The perpendicularly applied electric field causes a decrease of the azimuthal director angle at the substrate with the conical surface anchoring. In the cells with d = 22 μm, the defect loops having the under-twisted and over-twisted areas are formed. At the defect loop the pair of point peculiarities is observed where the 180° jump of azimuthal angle of the director occurs. Under the action of electric field the loops shrink and disappear. In the cells with d = 13 μm, the over-twisted and under-twisted defect lines are formed. Applied voltage results in the shortening of lines or/and their transformation into a defect of the third type. The director field distribution near defect lines of three types has been investigated by the polarising microscopy techniques. It has been revealed that the length ratio between the over-twisted and third-type defect lines can be controlled by the electric field. |
format | Online Article Text |
id | pubmed-7078221 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Nature Publishing Group UK |
record_format | MEDLINE/PubMed |
spelling | pubmed-70782212020-03-23 Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions Krakhalev, Mikhail N. Prishchepa, Oxana O. Sutormin, Vitaly S. Bikbaev, Rashid G. Timofeev, Ivan V. Zyryanov, Victor Ya. Sci Rep Article Electric-field-induced changes of the orientational structures of cholesteric liquid crystal layer with the tangential-conical boundary conditions have been investigated. The samples with the ratio of the cholesteric layer thickness d to the helix pitch p equalled to 0.57 have been considered. The perpendicularly applied electric field causes a decrease of the azimuthal director angle at the substrate with the conical surface anchoring. In the cells with d = 22 μm, the defect loops having the under-twisted and over-twisted areas are formed. At the defect loop the pair of point peculiarities is observed where the 180° jump of azimuthal angle of the director occurs. Under the action of electric field the loops shrink and disappear. In the cells with d = 13 μm, the over-twisted and under-twisted defect lines are formed. Applied voltage results in the shortening of lines or/and their transformation into a defect of the third type. The director field distribution near defect lines of three types has been investigated by the polarising microscopy techniques. It has been revealed that the length ratio between the over-twisted and third-type defect lines can be controlled by the electric field. Nature Publishing Group UK 2020-03-17 /pmc/articles/PMC7078221/ /pubmed/32184447 http://dx.doi.org/10.1038/s41598-020-61713-9 Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/. |
spellingShingle | Article Krakhalev, Mikhail N. Prishchepa, Oxana O. Sutormin, Vitaly S. Bikbaev, Rashid G. Timofeev, Ivan V. Zyryanov, Victor Ya. Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions |
title | Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions |
title_full | Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions |
title_fullStr | Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions |
title_full_unstemmed | Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions |
title_short | Electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions |
title_sort | electrically induced transformations of defects in cholesteric layer with tangential-conical boundary conditions |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7078221/ https://www.ncbi.nlm.nih.gov/pubmed/32184447 http://dx.doi.org/10.1038/s41598-020-61713-9 |
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