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Predicting the number of defects in a new software version
Predicting the number of defects in software at the method level is important. However, little or no research has focused on method-level defect prediction. Therefore, considerable efforts are still required to demonstrate how method-level defect prediction can be achieved for a new software version...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Public Library of Science
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7080245/ https://www.ncbi.nlm.nih.gov/pubmed/32187181 http://dx.doi.org/10.1371/journal.pone.0229131 |
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author | Felix, Ebubeogu Amarachukwu Lee, Sai Peck |
author_facet | Felix, Ebubeogu Amarachukwu Lee, Sai Peck |
author_sort | Felix, Ebubeogu Amarachukwu |
collection | PubMed |
description | Predicting the number of defects in software at the method level is important. However, little or no research has focused on method-level defect prediction. Therefore, considerable efforts are still required to demonstrate how method-level defect prediction can be achieved for a new software version. In the current study, we present an analysis of the relevant information obtained from the current version of a software product to construct regression models to predict the estimated number of defects in a new version using the variables of defect density, defect velocity and defect introduction time, which show considerable correlation with the number of method-level defects. These variables also show a mathematical relationship between defect density and defect acceleration at the method level, further indicating that the increase in the number of defects and the defect density are functions of the defect acceleration. We report an experiment conducted on the Finding Faults Using Ensemble Learners (ELFF) open-source Java projects, which contain 289,132 methods. The results show correlation coefficients of 60% for the defect density, -4% for the defect introduction time, and 93% for the defect velocity. These findings indicate that the average defect velocity shows a firm and considerable correlation with the number of defects at the method level. The proposed approach also motivates an investigation and comparison of the average performances of classifiers before and after method-level data preprocessing and of the level of entropy in the datasets. |
format | Online Article Text |
id | pubmed-7080245 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | Public Library of Science |
record_format | MEDLINE/PubMed |
spelling | pubmed-70802452020-03-24 Predicting the number of defects in a new software version Felix, Ebubeogu Amarachukwu Lee, Sai Peck PLoS One Research Article Predicting the number of defects in software at the method level is important. However, little or no research has focused on method-level defect prediction. Therefore, considerable efforts are still required to demonstrate how method-level defect prediction can be achieved for a new software version. In the current study, we present an analysis of the relevant information obtained from the current version of a software product to construct regression models to predict the estimated number of defects in a new version using the variables of defect density, defect velocity and defect introduction time, which show considerable correlation with the number of method-level defects. These variables also show a mathematical relationship between defect density and defect acceleration at the method level, further indicating that the increase in the number of defects and the defect density are functions of the defect acceleration. We report an experiment conducted on the Finding Faults Using Ensemble Learners (ELFF) open-source Java projects, which contain 289,132 methods. The results show correlation coefficients of 60% for the defect density, -4% for the defect introduction time, and 93% for the defect velocity. These findings indicate that the average defect velocity shows a firm and considerable correlation with the number of defects at the method level. The proposed approach also motivates an investigation and comparison of the average performances of classifiers before and after method-level data preprocessing and of the level of entropy in the datasets. Public Library of Science 2020-03-18 /pmc/articles/PMC7080245/ /pubmed/32187181 http://dx.doi.org/10.1371/journal.pone.0229131 Text en © 2020 Ebubeogu, Lee http://creativecommons.org/licenses/by/4.0/ This is an open access article distributed under the terms of the Creative Commons Attribution License (http://creativecommons.org/licenses/by/4.0/) , which permits unrestricted use, distribution, and reproduction in any medium, provided the original author and source are credited. |
spellingShingle | Research Article Felix, Ebubeogu Amarachukwu Lee, Sai Peck Predicting the number of defects in a new software version |
title | Predicting the number of defects in a new software version |
title_full | Predicting the number of defects in a new software version |
title_fullStr | Predicting the number of defects in a new software version |
title_full_unstemmed | Predicting the number of defects in a new software version |
title_short | Predicting the number of defects in a new software version |
title_sort | predicting the number of defects in a new software version |
topic | Research Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7080245/ https://www.ncbi.nlm.nih.gov/pubmed/32187181 http://dx.doi.org/10.1371/journal.pone.0229131 |
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