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New approach for FIB-preparation of atom probe specimens for aluminum alloys
Site-specific atom probe tomography (APT) from aluminum alloys has been limited by sample preparation issues. Indeed, Ga, which is conventionally used in focused-ion beam (FIB) preparations, has a high affinity for Al grain boundaries and causes their embrittlement. This leads to high concentrations...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Public Library of Science
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7117760/ https://www.ncbi.nlm.nih.gov/pubmed/32240256 http://dx.doi.org/10.1371/journal.pone.0231179 |