Atomic‐Scale Mapping of Impurities in Partially Reduced Hollow TiO(2) Nanowires

The incorporation of impurities during the chemical synthesis of nanomaterials is usually uncontrolled and rarely reported because of the formidable challenge in measuring trace amounts of often light elements with sub‐nanometer spatial resolution. And yet, these foreign elements (introduced by dopi...

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Detalles Bibliográficos
Autores principales: Lim, Joohyun, Kim, Se‐Ho, Aymerich Armengol, Raquel, Kasian, Olga, Choi, Pyuck‐Pa, Stephenson, Leigh T., Gault, Baptiste, Scheu, Christina
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2020
Materias:
Communications
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7155045/
https://www.ncbi.nlm.nih.gov/pubmed/31922307
http://dx.doi.org/10.1002/anie.201915709

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7155045/
https://www.ncbi.nlm.nih.gov/pubmed/31922307
http://dx.doi.org/10.1002/anie.201915709

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