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Unraveling the Impact of Halide Mixing on Perovskite Stability

[Image: see text] Increasing the stability of perovskites is essential for their integration in commercial photovoltaic devices. Halide mixing is suggested as a powerful strategy toward stable perovskite materials. However, the stabilizing effect of the halides critically depends on their distributi...

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Detalles Bibliográficos
Autores principales: Hieulle, Jeremy, Wang, Xiaoming, Stecker, Collin, Son, Dae-Yong, Qiu, Longbin, Ohmann, Robin, Ono, Luis K., Mugarza, Aitor, Yan, Yanfa, Qi, Yabing
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2019
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7156144/
https://www.ncbi.nlm.nih.gov/pubmed/30646682
http://dx.doi.org/10.1021/jacs.8b11210
Descripción
Sumario:[Image: see text] Increasing the stability of perovskites is essential for their integration in commercial photovoltaic devices. Halide mixing is suggested as a powerful strategy toward stable perovskite materials. However, the stabilizing effect of the halides critically depends on their distribution in the mixed compound, a topic that is currently under intense debate. Here we successfully determine the exact location of the I and Cl anions in the  CH(3)NH(3)PbBr(3–y)I(y) and CH(3)NH(3)PbBr(3–z)Cl(z) mixed halide perovskite lattices and correlate it with the enhanced stability we find for the latter. By combining scanning tunneling microscopy and density functional theory, we predict that, for low ratios, iodine and chlorine incorporation have different effects on the electronic properties and stability of the CH(3)NH(3)PbBr(3) perovskite material. In addition, we determine the optimal Cl incorporation ratio for stability increase without detrimental band gap modification, providing an important direction for the fabrication of stable perovskite devices. The increased material stability induced by chlorine incorporation is verified by performing photoelectron spectroscopy on a half-cell device architecture. Our findings provide an answer to the current debate on halide incorporation and demonstrate their direct influence on device stability.