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Combining X-Ray Crystallography and Electron Microscopy
The combination of cryo-electron microscopy to study large biological assemblies at low resolution with crystallography to determine near atomic structures of assembly fragments is quickly expanding the horizon of structural biology. This technique can be used to advantage in the study of large stru...
Autores principales: | , , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Elsevier Ltd.
2005
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7173138/ https://www.ncbi.nlm.nih.gov/pubmed/15766536 http://dx.doi.org/10.1016/j.str.2005.01.005 |
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author | Rossmann, Michael G. Morais, Marc C. Leiman, Petr G. Zhang, Wei |
author_facet | Rossmann, Michael G. Morais, Marc C. Leiman, Petr G. Zhang, Wei |
author_sort | Rossmann, Michael G. |
collection | PubMed |
description | The combination of cryo-electron microscopy to study large biological assemblies at low resolution with crystallography to determine near atomic structures of assembly fragments is quickly expanding the horizon of structural biology. This technique can be used to advantage in the study of large structures that cannot be crystallized, to follow dynamic processes, and to “purify” samples by visual selection of particles. Factors affecting the quality of cryo-electron microscopy maps and limits of accuracy in fitting known structural fragments are discussed. |
format | Online Article Text |
id | pubmed-7173138 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2005 |
publisher | Elsevier Ltd. |
record_format | MEDLINE/PubMed |
spelling | pubmed-71731382020-04-22 Combining X-Ray Crystallography and Electron Microscopy Rossmann, Michael G. Morais, Marc C. Leiman, Petr G. Zhang, Wei Structure Review The combination of cryo-electron microscopy to study large biological assemblies at low resolution with crystallography to determine near atomic structures of assembly fragments is quickly expanding the horizon of structural biology. This technique can be used to advantage in the study of large structures that cannot be crystallized, to follow dynamic processes, and to “purify” samples by visual selection of particles. Factors affecting the quality of cryo-electron microscopy maps and limits of accuracy in fitting known structural fragments are discussed. Elsevier Ltd. 2005-03 2005-03-09 /pmc/articles/PMC7173138/ /pubmed/15766536 http://dx.doi.org/10.1016/j.str.2005.01.005 Text en Copyright © 2005 Elsevier Ltd. All rights reserved. Since January 2020 Elsevier has created a COVID-19 resource centre with free information in English and Mandarin on the novel coronavirus COVID-19. The COVID-19 resource centre is hosted on Elsevier Connect, the company's public news and information website. Elsevier hereby grants permission to make all its COVID-19-related research that is available on the COVID-19 resource centre - including this research content - immediately available in PubMed Central and other publicly funded repositories, such as the WHO COVID database with rights for unrestricted research re-use and analyses in any form or by any means with acknowledgement of the original source. These permissions are granted for free by Elsevier for as long as the COVID-19 resource centre remains active. |
spellingShingle | Review Rossmann, Michael G. Morais, Marc C. Leiman, Petr G. Zhang, Wei Combining X-Ray Crystallography and Electron Microscopy |
title | Combining X-Ray Crystallography and Electron Microscopy |
title_full | Combining X-Ray Crystallography and Electron Microscopy |
title_fullStr | Combining X-Ray Crystallography and Electron Microscopy |
title_full_unstemmed | Combining X-Ray Crystallography and Electron Microscopy |
title_short | Combining X-Ray Crystallography and Electron Microscopy |
title_sort | combining x-ray crystallography and electron microscopy |
topic | Review |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7173138/ https://www.ncbi.nlm.nih.gov/pubmed/15766536 http://dx.doi.org/10.1016/j.str.2005.01.005 |
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