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Deep learning enables structured illumination microscopy with low light levels and enhanced speed

Structured illumination microscopy (SIM) surpasses the optical diffraction limit and offers a two-fold enhancement in resolution over diffraction limited microscopy. However, it requires both intense illumination and multiple acquisitions to produce a single high-resolution image. Using deep learnin...

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Detalles Bibliográficos
Autores principales:	Jin, Luhong, Liu, Bei, Zhao, Fenqiang, Hahn, Stephen, Dong, Bowei, Song, Ruiyan, Elston, Timothy C., Xu, Yingke, Hahn, Klaus M.
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	Nature Publishing Group UK 2020
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7176720/ https://www.ncbi.nlm.nih.gov/pubmed/32321916 http://dx.doi.org/10.1038/s41467-020-15784-x

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