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Surface Defect System for Long Product Manufacturing Using Differential Topographic Images
Current industrial products must meet quality requirements defined by international standards. Most commercial surface inspection systems give qualitative detections after a long, cumbersome and very expensive configuration process made by the seller company. In this paper, a new surface defect dete...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7180480/ https://www.ncbi.nlm.nih.gov/pubmed/32290161 http://dx.doi.org/10.3390/s20072142 |
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author | delaCalle Herrero, F.J. García, Daniel F. Usamentiaga, Rubén |
author_facet | delaCalle Herrero, F.J. García, Daniel F. Usamentiaga, Rubén |
author_sort | delaCalle Herrero, F.J. |
collection | PubMed |
description | Current industrial products must meet quality requirements defined by international standards. Most commercial surface inspection systems give qualitative detections after a long, cumbersome and very expensive configuration process made by the seller company. In this paper, a new surface defect detection method is proposed based on 3D laser reconstruction. The method compares the long products, scan by scan, with their desired shape and produces differential topographic images of the surface at very high speeds. This work proposes a novel method where the values of the pixels in the images have a direct translation to real-world dimensions, which enables a detection based on the tolerances defined by international standards. These images are processed using computer vision techniques to detect defects and filter erroneous detections using both statistical distributions and a multilayer perceptron. Moreover, a systematic configuration procedure is proposed that is repeatable and can be performed by the manufacturer. The method has been tested using train track rails, which reports better results than two photometric systems including one commercial system, in both defect detection and erroneous detection rate. The method has been validated using a surface inspection rail pattern showing excellent performance. |
format | Online Article Text |
id | pubmed-7180480 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-71804802020-05-01 Surface Defect System for Long Product Manufacturing Using Differential Topographic Images delaCalle Herrero, F.J. García, Daniel F. Usamentiaga, Rubén Sensors (Basel) Article Current industrial products must meet quality requirements defined by international standards. Most commercial surface inspection systems give qualitative detections after a long, cumbersome and very expensive configuration process made by the seller company. In this paper, a new surface defect detection method is proposed based on 3D laser reconstruction. The method compares the long products, scan by scan, with their desired shape and produces differential topographic images of the surface at very high speeds. This work proposes a novel method where the values of the pixels in the images have a direct translation to real-world dimensions, which enables a detection based on the tolerances defined by international standards. These images are processed using computer vision techniques to detect defects and filter erroneous detections using both statistical distributions and a multilayer perceptron. Moreover, a systematic configuration procedure is proposed that is repeatable and can be performed by the manufacturer. The method has been tested using train track rails, which reports better results than two photometric systems including one commercial system, in both defect detection and erroneous detection rate. The method has been validated using a surface inspection rail pattern showing excellent performance. MDPI 2020-04-10 /pmc/articles/PMC7180480/ /pubmed/32290161 http://dx.doi.org/10.3390/s20072142 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article delaCalle Herrero, F.J. García, Daniel F. Usamentiaga, Rubén Surface Defect System for Long Product Manufacturing Using Differential Topographic Images |
title | Surface Defect System for Long Product Manufacturing Using Differential Topographic Images |
title_full | Surface Defect System for Long Product Manufacturing Using Differential Topographic Images |
title_fullStr | Surface Defect System for Long Product Manufacturing Using Differential Topographic Images |
title_full_unstemmed | Surface Defect System for Long Product Manufacturing Using Differential Topographic Images |
title_short | Surface Defect System for Long Product Manufacturing Using Differential Topographic Images |
title_sort | surface defect system for long product manufacturing using differential topographic images |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7180480/ https://www.ncbi.nlm.nih.gov/pubmed/32290161 http://dx.doi.org/10.3390/s20072142 |
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