Surface Defect System for Long Product Manufacturing Using Differential Topographic Images

Current industrial products must meet quality requirements defined by international standards. Most commercial surface inspection systems give qualitative detections after a long, cumbersome and very expensive configuration process made by the seller company. In this paper, a new surface defect dete...

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Detalles Bibliográficos
Autores principales: delaCalle Herrero, F.J., García, Daniel F., Usamentiaga, Rubén
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7180480/
https://www.ncbi.nlm.nih.gov/pubmed/32290161
http://dx.doi.org/10.3390/s20072142

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7180480/
https://www.ncbi.nlm.nih.gov/pubmed/32290161
http://dx.doi.org/10.3390/s20072142

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