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Surface Defect System for Long Product Manufacturing Using Differential Topographic Images
Current industrial products must meet quality requirements defined by international standards. Most commercial surface inspection systems give qualitative detections after a long, cumbersome and very expensive configuration process made by the seller company. In this paper, a new surface defect dete...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7180480/ https://www.ncbi.nlm.nih.gov/pubmed/32290161 http://dx.doi.org/10.3390/s20072142 |