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Electromigration-induced directional steps towards the formation of single atomic Ag contacts

Even though there have been many experimental attempts and theoretical approaches to understand the process of electromigration (EM), it has not been quantitatively understood for ultrathin structures and at grain boundaries. Nevertheless, we showed recently that it can be used reliably for the form...

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Detalles Bibliográficos
Autores principales: Chatterjee, Atasi, Tegenkamp, Christoph, Pfnür, Herbert
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7188988/
https://www.ncbi.nlm.nih.gov/pubmed/32395398
http://dx.doi.org/10.3762/bjnano.11.55

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