Interfacial dielectric layer as an origin of polarization fatigue in ferroelectric capacitors

Origins of polarization fatigue in ferroelectric capacitors under electric field cycling still remain unclear. Here, we experimentally identify origins of polarization fatigue in ferroelectric PbZr(0.52)Ti(0.48)O(3) (PZT) thin-film capacitors by investigating their fatigue behaviours and interface s...

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Detalles Bibliográficos
Autores principales: Do, M. T., Gauquelin, N., Nguyen, M. D., Wang, J., Verbeeck, J., Blom, F., Koster, G., Houwman, E. P., Rijnders, G.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7192946/
https://www.ncbi.nlm.nih.gov/pubmed/32355206
http://dx.doi.org/10.1038/s41598-020-64451-0

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7192946/
https://www.ncbi.nlm.nih.gov/pubmed/32355206
http://dx.doi.org/10.1038/s41598-020-64451-0

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