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Near-threshold fatigue crack propagation without oxide-induced crack closure

An accurate value for the threshold stress intensity factor range, ΔK(th), is a key parameter for studying crack-like defects. However, it is difficult to obtain accurate ΔK(th) values due to oxide-induced crack closure. In this study, we report conditions for minimizing the effects of oxide-induced...

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Autores principales: Tazoe, Koki, Tanaka, Hiroto, Oka, Masanori, Yagawa, Genki
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7220940/
https://www.ncbi.nlm.nih.gov/pubmed/32404923
http://dx.doi.org/10.1038/s41598-020-64915-3
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author Tazoe, Koki
Tanaka, Hiroto
Oka, Masanori
Yagawa, Genki
author_facet Tazoe, Koki
Tanaka, Hiroto
Oka, Masanori
Yagawa, Genki
author_sort Tazoe, Koki
collection PubMed
description An accurate value for the threshold stress intensity factor range, ΔK(th), is a key parameter for studying crack-like defects. However, it is difficult to obtain accurate ΔK(th) values due to oxide-induced crack closure. In this study, we report conditions for minimizing the effects of oxide-induced crack closure near the threshold region, where a concave curve of the effect on the loading frequency on oxide-induced crack closure is achieved. The resulting conditions allow for an accurate determination of ΔK(th), which is a key material parameter relating to the pertinent loading ratio.
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spelling pubmed-72209402020-05-20 Near-threshold fatigue crack propagation without oxide-induced crack closure Tazoe, Koki Tanaka, Hiroto Oka, Masanori Yagawa, Genki Sci Rep Article An accurate value for the threshold stress intensity factor range, ΔK(th), is a key parameter for studying crack-like defects. However, it is difficult to obtain accurate ΔK(th) values due to oxide-induced crack closure. In this study, we report conditions for minimizing the effects of oxide-induced crack closure near the threshold region, where a concave curve of the effect on the loading frequency on oxide-induced crack closure is achieved. The resulting conditions allow for an accurate determination of ΔK(th), which is a key material parameter relating to the pertinent loading ratio. Nature Publishing Group UK 2020-05-13 /pmc/articles/PMC7220940/ /pubmed/32404923 http://dx.doi.org/10.1038/s41598-020-64915-3 Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Tazoe, Koki
Tanaka, Hiroto
Oka, Masanori
Yagawa, Genki
Near-threshold fatigue crack propagation without oxide-induced crack closure
title Near-threshold fatigue crack propagation without oxide-induced crack closure
title_full Near-threshold fatigue crack propagation without oxide-induced crack closure
title_fullStr Near-threshold fatigue crack propagation without oxide-induced crack closure
title_full_unstemmed Near-threshold fatigue crack propagation without oxide-induced crack closure
title_short Near-threshold fatigue crack propagation without oxide-induced crack closure
title_sort near-threshold fatigue crack propagation without oxide-induced crack closure
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7220940/
https://www.ncbi.nlm.nih.gov/pubmed/32404923
http://dx.doi.org/10.1038/s41598-020-64915-3
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