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Colloidal-ALD-Grown Core/Shell CdSe/CdS Nanoplatelets as Seen by DNP Enhanced PASS–PIETA NMR Spectroscopy

[Image: see text] Ligand exchange and CdS shell growth onto colloidal CdSe nanoplatelets (NPLs) using colloidal atomic layer deposition (c-ALD) were investigated by solid-state nuclear magnetic resonance (NMR) experiments, in particular, dynamic nuclear polarization (DNP) enhanced phase adjusted spi...

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Detalles Bibliográficos
Autores principales: Piveteau, Laura, Dirin, Dmitry N., Gordon, Christopher P., Walder, Brennan J., Ong, Ta-Chung, Emsley, Lyndon, Copéret, Christophe, Kovalenko, Maksym V.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: American Chemical Society 2020
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7227022/
https://www.ncbi.nlm.nih.gov/pubmed/32078332
http://dx.doi.org/10.1021/acs.nanolett.9b04870
Descripción
Sumario:[Image: see text] Ligand exchange and CdS shell growth onto colloidal CdSe nanoplatelets (NPLs) using colloidal atomic layer deposition (c-ALD) were investigated by solid-state nuclear magnetic resonance (NMR) experiments, in particular, dynamic nuclear polarization (DNP) enhanced phase adjusted spinning sidebands–phase incremented echo-train acquisition (PASS–PIETA). The improved sensitivity and resolution of DNP enhanced PASS–PIETA permits the identification and study of the core, shell, and surface species of CdSe and CdSe/CdS core/shell NPLs heterostructures at all stages of c-ALD. The cadmium chemical shielding was found to be proportionally dependent on the number and nature of coordinating chalcogen-based ligands. DFT calculations permitted the separation of the the (111/113)Cd chemical shielding into its different components, revealing that the varying strength of paramagnetic and spin–orbit shielding contributions are responsible for the chemical shielding trend of cadmium chalcogenides. Overall, this study points to the roughening and increased chemical disorder at the surface during the shell growth process, which is not readily captured by the conventional characterization tools such as electron microscopy.