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Partial Scanning Transmission Electron Microscopy with Deep Learning
Compressed sensing algorithms are used to decrease electron microscope scan time and electron beam exposure with minimal information loss. Following successful applications of deep learning to compressed sensing, we have developed a two-stage multiscale generative adversarial neural network to compl...
| Autores principales: | , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
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Nature Publishing Group UK
2020
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| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7239858/ https://www.ncbi.nlm.nih.gov/pubmed/32433582 http://dx.doi.org/10.1038/s41598-020-65261-0 |