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Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout

Direct Interface Circuits (DICs) carry out resistive sensor readings using a resistance-to-time-to-digital conversion without the need for analog-to-digital converters. The main advantage of this approach is the simplicity involved in designing a DIC, which only requires some additional resistors an...

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Autores principales: Hidalgo-López, José A., Sánchez-Durán, José A., Oballe-Peinado, Óscar
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7249154/
https://www.ncbi.nlm.nih.gov/pubmed/32370230
http://dx.doi.org/10.3390/s20092596
_version_ 1783538538474635264
author Hidalgo-López, José A.
Sánchez-Durán, José A.
Oballe-Peinado, Óscar
author_facet Hidalgo-López, José A.
Sánchez-Durán, José A.
Oballe-Peinado, Óscar
author_sort Hidalgo-López, José A.
collection PubMed
description Direct Interface Circuits (DICs) carry out resistive sensor readings using a resistance-to-time-to-digital conversion without the need for analog-to-digital converters. The main advantage of this approach is the simplicity involved in designing a DIC, which only requires some additional resistors and a capacitor in order to perform the conversion. The main drawback is the time needed for this conversion, which is given by the sum of up to three capacitor charge times and their associated discharge times. This article presents a modification of the most widely used estimation method in a resistive DIC, which is known as the Two-Point Calibration Method (TPCM), in which a single additional programmable digital device pin in the DIC and one extra measurement in each discharge cycle, made without slowing down the cycle, allow charge times to be reduced more than 20-fold to values around 2 µs. The new method designed to achieve this reduction only penalizes relative errors with a small increase of between 0.2% and 0.3% for most values in the tested resistance range.
format Online
Article
Text
id pubmed-7249154
institution National Center for Biotechnology Information
language English
publishDate 2020
publisher MDPI
record_format MEDLINE/PubMed
spelling pubmed-72491542020-06-10 Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout Hidalgo-López, José A. Sánchez-Durán, José A. Oballe-Peinado, Óscar Sensors (Basel) Article Direct Interface Circuits (DICs) carry out resistive sensor readings using a resistance-to-time-to-digital conversion without the need for analog-to-digital converters. The main advantage of this approach is the simplicity involved in designing a DIC, which only requires some additional resistors and a capacitor in order to perform the conversion. The main drawback is the time needed for this conversion, which is given by the sum of up to three capacitor charge times and their associated discharge times. This article presents a modification of the most widely used estimation method in a resistive DIC, which is known as the Two-Point Calibration Method (TPCM), in which a single additional programmable digital device pin in the DIC and one extra measurement in each discharge cycle, made without slowing down the cycle, allow charge times to be reduced more than 20-fold to values around 2 µs. The new method designed to achieve this reduction only penalizes relative errors with a small increase of between 0.2% and 0.3% for most values in the tested resistance range. MDPI 2020-05-02 /pmc/articles/PMC7249154/ /pubmed/32370230 http://dx.doi.org/10.3390/s20092596 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Hidalgo-López, José A.
Sánchez-Durán, José A.
Oballe-Peinado, Óscar
Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout
title Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout
title_full Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout
title_fullStr Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout
title_full_unstemmed Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout
title_short Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout
title_sort reducing measurement time in direct interface circuits for resistive sensor readout
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7249154/
https://www.ncbi.nlm.nih.gov/pubmed/32370230
http://dx.doi.org/10.3390/s20092596
work_keys_str_mv AT hidalgolopezjosea reducingmeasurementtimeindirectinterfacecircuitsforresistivesensorreadout
AT sanchezduranjosea reducingmeasurementtimeindirectinterfacecircuitsforresistivesensorreadout
AT oballepeinadooscar reducingmeasurementtimeindirectinterfacecircuitsforresistivesensorreadout