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Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout
Direct Interface Circuits (DICs) carry out resistive sensor readings using a resistance-to-time-to-digital conversion without the need for analog-to-digital converters. The main advantage of this approach is the simplicity involved in designing a DIC, which only requires some additional resistors an...
Autores principales: | , , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
MDPI
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7249154/ https://www.ncbi.nlm.nih.gov/pubmed/32370230 http://dx.doi.org/10.3390/s20092596 |
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author | Hidalgo-López, José A. Sánchez-Durán, José A. Oballe-Peinado, Óscar |
author_facet | Hidalgo-López, José A. Sánchez-Durán, José A. Oballe-Peinado, Óscar |
author_sort | Hidalgo-López, José A. |
collection | PubMed |
description | Direct Interface Circuits (DICs) carry out resistive sensor readings using a resistance-to-time-to-digital conversion without the need for analog-to-digital converters. The main advantage of this approach is the simplicity involved in designing a DIC, which only requires some additional resistors and a capacitor in order to perform the conversion. The main drawback is the time needed for this conversion, which is given by the sum of up to three capacitor charge times and their associated discharge times. This article presents a modification of the most widely used estimation method in a resistive DIC, which is known as the Two-Point Calibration Method (TPCM), in which a single additional programmable digital device pin in the DIC and one extra measurement in each discharge cycle, made without slowing down the cycle, allow charge times to be reduced more than 20-fold to values around 2 µs. The new method designed to achieve this reduction only penalizes relative errors with a small increase of between 0.2% and 0.3% for most values in the tested resistance range. |
format | Online Article Text |
id | pubmed-7249154 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | MDPI |
record_format | MEDLINE/PubMed |
spelling | pubmed-72491542020-06-10 Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout Hidalgo-López, José A. Sánchez-Durán, José A. Oballe-Peinado, Óscar Sensors (Basel) Article Direct Interface Circuits (DICs) carry out resistive sensor readings using a resistance-to-time-to-digital conversion without the need for analog-to-digital converters. The main advantage of this approach is the simplicity involved in designing a DIC, which only requires some additional resistors and a capacitor in order to perform the conversion. The main drawback is the time needed for this conversion, which is given by the sum of up to three capacitor charge times and their associated discharge times. This article presents a modification of the most widely used estimation method in a resistive DIC, which is known as the Two-Point Calibration Method (TPCM), in which a single additional programmable digital device pin in the DIC and one extra measurement in each discharge cycle, made without slowing down the cycle, allow charge times to be reduced more than 20-fold to values around 2 µs. The new method designed to achieve this reduction only penalizes relative errors with a small increase of between 0.2% and 0.3% for most values in the tested resistance range. MDPI 2020-05-02 /pmc/articles/PMC7249154/ /pubmed/32370230 http://dx.doi.org/10.3390/s20092596 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/). |
spellingShingle | Article Hidalgo-López, José A. Sánchez-Durán, José A. Oballe-Peinado, Óscar Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout |
title | Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout |
title_full | Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout |
title_fullStr | Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout |
title_full_unstemmed | Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout |
title_short | Reducing Measurement Time in Direct Interface Circuits for Resistive Sensor Readout |
title_sort | reducing measurement time in direct interface circuits for resistive sensor readout |
topic | Article |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7249154/ https://www.ncbi.nlm.nih.gov/pubmed/32370230 http://dx.doi.org/10.3390/s20092596 |
work_keys_str_mv | AT hidalgolopezjosea reducingmeasurementtimeindirectinterfacecircuitsforresistivesensorreadout AT sanchezduranjosea reducingmeasurementtimeindirectinterfacecircuitsforresistivesensorreadout AT oballepeinadooscar reducingmeasurementtimeindirectinterfacecircuitsforresistivesensorreadout |