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Gradient Estimator-Based Amplitude Estimation for Dynamic Mode Atomic Force Microscopy: Small-Signal Modeling and Tuning

Atomic force microscopy (AFM) plays an important role in nanoscale imaging application. AFM works by oscillating a microcantilever on the surface of the sample being scanned. In this process, estimating the amplitude of the cantilever deflection signal plays an important role in characterizing the t...

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Detalles Bibliográficos
Autores principales:	Ahmed, Hafiz, Benbouzid, Mohamed
Formato:	Online Artículo Texto
Lenguaje:	English
Publicado:	MDPI 2020
Materias:	Article
Acceso en línea:	https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7249209/ https://www.ncbi.nlm.nih.gov/pubmed/32397441 http://dx.doi.org/10.3390/s20092703

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