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Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO(3) Using Scanning Probe Microscopy Approach

In this work we demonstrate the role of grain boundaries and domain walls in the local transport properties of n- and p-doped bismuth ferrites, including the influence of these singularities on the space charge imbalance of the energy band structure. This is mainly due to the charge accumulation at...

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Autores principales: Ivanov, Maxim S., Khomchenko, Vladimir A., Silibin, Maxim V., Karpinsky, Dmitry V., Blawert, Carsten, Serdechnova, Maria, Paixão, José A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7279369/
https://www.ncbi.nlm.nih.gov/pubmed/32422891
http://dx.doi.org/10.3390/nano10050940
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author Ivanov, Maxim S.
Khomchenko, Vladimir A.
Silibin, Maxim V.
Karpinsky, Dmitry V.
Blawert, Carsten
Serdechnova, Maria
Paixão, José A.
author_facet Ivanov, Maxim S.
Khomchenko, Vladimir A.
Silibin, Maxim V.
Karpinsky, Dmitry V.
Blawert, Carsten
Serdechnova, Maria
Paixão, José A.
author_sort Ivanov, Maxim S.
collection PubMed
description In this work we demonstrate the role of grain boundaries and domain walls in the local transport properties of n- and p-doped bismuth ferrites, including the influence of these singularities on the space charge imbalance of the energy band structure. This is mainly due to the charge accumulation at domain walls, which is recognized as the main mechanism responsible for the electrical conductivity in polar thin films and single crystals, while there is an obvious gap in the understanding of the precise mechanism of conductivity in ferroelectric ceramics. The conductivity of the Bi(0.95)Ca(0.05)Fe(1−x)Ti(x)O(3−δ) (x = 0, 0.05, 0.1; δ = (0.05 − x)/2) samples was studied using a scanning probe microscopy approach at the nanoscale level as a function of bias voltage and chemical composition. The obtained results reveal a distinct correlation between electrical properties and the type of charged defects when the anion-deficient (x = 0) compound exhibits a three order of magnitude increase in conductivity as compared with the charge-balanced (x = 0.05) and cation-deficient (x = 0.1) samples, which is well described within the band diagram representation. The data provide an approach to control the transport properties of multiferroic bismuth ferrites through aliovalent chemical substitution.
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spelling pubmed-72793692020-06-17 Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO(3) Using Scanning Probe Microscopy Approach Ivanov, Maxim S. Khomchenko, Vladimir A. Silibin, Maxim V. Karpinsky, Dmitry V. Blawert, Carsten Serdechnova, Maria Paixão, José A. Nanomaterials (Basel) Article In this work we demonstrate the role of grain boundaries and domain walls in the local transport properties of n- and p-doped bismuth ferrites, including the influence of these singularities on the space charge imbalance of the energy band structure. This is mainly due to the charge accumulation at domain walls, which is recognized as the main mechanism responsible for the electrical conductivity in polar thin films and single crystals, while there is an obvious gap in the understanding of the precise mechanism of conductivity in ferroelectric ceramics. The conductivity of the Bi(0.95)Ca(0.05)Fe(1−x)Ti(x)O(3−δ) (x = 0, 0.05, 0.1; δ = (0.05 − x)/2) samples was studied using a scanning probe microscopy approach at the nanoscale level as a function of bias voltage and chemical composition. The obtained results reveal a distinct correlation between electrical properties and the type of charged defects when the anion-deficient (x = 0) compound exhibits a three order of magnitude increase in conductivity as compared with the charge-balanced (x = 0.05) and cation-deficient (x = 0.1) samples, which is well described within the band diagram representation. The data provide an approach to control the transport properties of multiferroic bismuth ferrites through aliovalent chemical substitution. MDPI 2020-05-14 /pmc/articles/PMC7279369/ /pubmed/32422891 http://dx.doi.org/10.3390/nano10050940 Text en © 2020 by the authors. Licensee MDPI, Basel, Switzerland. This article is an open access article distributed under the terms and conditions of the Creative Commons Attribution (CC BY) license (http://creativecommons.org/licenses/by/4.0/).
spellingShingle Article
Ivanov, Maxim S.
Khomchenko, Vladimir A.
Silibin, Maxim V.
Karpinsky, Dmitry V.
Blawert, Carsten
Serdechnova, Maria
Paixão, José A.
Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO(3) Using Scanning Probe Microscopy Approach
title Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO(3) Using Scanning Probe Microscopy Approach
title_full Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO(3) Using Scanning Probe Microscopy Approach
title_fullStr Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO(3) Using Scanning Probe Microscopy Approach
title_full_unstemmed Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO(3) Using Scanning Probe Microscopy Approach
title_short Investigation of Local Conduction Mechanisms in Ca and Ti-Doped BiFeO(3) Using Scanning Probe Microscopy Approach
title_sort investigation of local conduction mechanisms in ca and ti-doped bifeo(3) using scanning probe microscopy approach
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7279369/
https://www.ncbi.nlm.nih.gov/pubmed/32422891
http://dx.doi.org/10.3390/nano10050940
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