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Thin-Film MEMS Resistors with Enhanced Lifetime for Thermal Inkjet
In this paper, the failure mechanisms of the thermal inkjet thin-film resistors are recognized. Additionally, designs of resistors to overcome these mechanisms are suggested and tested by simulation and experiment. The resulting resistors are shown to have improved lifetimes, spanning an order of ma...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
MDPI
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7281151/ https://www.ncbi.nlm.nih.gov/pubmed/32423170 http://dx.doi.org/10.3390/mi11050499 |