Recent Applications of Advanced Atomic Force Microscopy in Polymer Science: A Review

Atomic force microscopy (AFM) has been extensively used for the nanoscale characterization of polymeric materials. The coupling of AFM with infrared spectroscope (AFM-IR) provides another advantage to the chemical analyses and thus helps to shed light upon the study of polymers. This paper reviews s...

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Detalles Bibliográficos
Autores principales: Nguyen-Tri, Phuong, Ghassemi, Payman, Carriere, Pascal, Nanda, Sonil, Assadi, Aymen Amine, Nguyen, Dinh Duc
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Review
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7284686/
https://www.ncbi.nlm.nih.gov/pubmed/32429499
http://dx.doi.org/10.3390/polym12051142

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