XTIP – the world’s first beamline dedicated to the synchrotron X-ray scanning tunneling microscopy technique

In recent years, there have been numerous efforts worldwide to develop the synchrotron X-ray scanning tunneling microscopy (SX-STM) technique. Here, the inauguration of XTIP, the world’s first beamline fully dedicated to SX-STM, is reported. The XTIP beamline is located at Sector 4 of the Advanced P...

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Detalles Bibliográficos
Autores principales: Rose, Volker, Shirato, Nozomi, Bartlein, Michael, Deriy, Alex, Ajayi, Tolulope, Rosenmann, Daniel, Hla, Saw-Wai, Fisher, Mike, Reininger, Ruben
Formato: Online Artículo Texto
Lenguaje:English
Publicado: International Union of Crystallography 2020
Materias:
Beamlines
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7285689/
https://www.ncbi.nlm.nih.gov/pubmed/32381788
http://dx.doi.org/10.1107/S1600577520003689
Descripción
Sumario:In recent years, there have been numerous efforts worldwide to develop the synchrotron X-ray scanning tunneling microscopy (SX-STM) technique. Here, the inauguration of XTIP, the world’s first beamline fully dedicated to SX-STM, is reported. The XTIP beamline is located at Sector 4 of the Advanced Photon Source at Argonne National Laboratory. It features an insertion device that can provide left- or right-circular as well as horizontal- and vertical-linear polarization. XTIP delivers monochromatic soft X-rays of between 400 and 1900 eV focused into an environmental enclosure that houses the endstation instrument. This article discusses the beamline system design and its performance.

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