Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose

Both high resolution and high precision are required to quantitatively determine the atomic structure of complex nanostructured materials. However, for conventional imaging methods in scanning transmission electron microscopy (STEM), atomic resolution with picometer precision cannot usually be achie...

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Detalles Bibliográficos
Autores principales: Chen, Zhen, Odstrcil, Michal, Jiang, Yi, Han, Yimo, Chiu, Ming-Hui, Li, Lain-Jong, Muller, David A.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Article
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7293311/
https://www.ncbi.nlm.nih.gov/pubmed/32533001
http://dx.doi.org/10.1038/s41467-020-16688-6

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7293311/
https://www.ncbi.nlm.nih.gov/pubmed/32533001
http://dx.doi.org/10.1038/s41467-020-16688-6

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