Cargando…
Mixed-state electron ptychography enables sub-angstrom resolution imaging with picometer precision at low dose
Both high resolution and high precision are required to quantitatively determine the atomic structure of complex nanostructured materials. However, for conventional imaging methods in scanning transmission electron microscopy (STEM), atomic resolution with picometer precision cannot usually be achie...
Autores principales: | Chen, Zhen, Odstrcil, Michal, Jiang, Yi, Han, Yimo, Chiu, Ming-Hui, Li, Lain-Jong, Muller, David A. |
---|---|
Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2020
|
Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7293311/ https://www.ncbi.nlm.nih.gov/pubmed/32533001 http://dx.doi.org/10.1038/s41467-020-16688-6 |
Ejemplares similares
-
Deep sub-angstrom resolution imaging by electron ptychography with misorientation correction
por: Sha, Haozhi, et al.
Publicado: (2022) -
Probing of sub-picometer vertical differential resolutions using cavity plasmons
por: Chen, Wen, et al.
Publicado: (2018) -
Bright Ångstrom and picometer free electron laser based on the Large Hadron electron Collider energy recovery linac
por: Nergiz, Z., et al.
Publicado: (2021) -
Nanoelectromechanical Position-Sensitive Detector
with Picometer Resolution
por: Chien, Miao-Hsuan, et al.
Publicado: (2020) -
Broadband picometer-scale resolution on-chip spectrometer with reconfigurable photonics
por: Yao, Chunhui, et al.
Publicado: (2023)