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Near Field Differential Interference Contrast Microscopy

Near field scanning optical microscopy exploiting differential interference contrast enhancement is demonstrated. Beam splitting in the near field region is implemented using a dual color probe based on plasmonic color sorter idea. This provides the ability to illuminate two neighboring points on th...

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Detalles Bibliográficos
Autores principales: Heydarian, Hesam, Yazdanfar, Payam, Zarif, Arezoo, Rashidian, Bizhan
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7295775/
https://www.ncbi.nlm.nih.gov/pubmed/32541881
http://dx.doi.org/10.1038/s41598-020-66482-z
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author Heydarian, Hesam
Yazdanfar, Payam
Zarif, Arezoo
Rashidian, Bizhan
author_facet Heydarian, Hesam
Yazdanfar, Payam
Zarif, Arezoo
Rashidian, Bizhan
author_sort Heydarian, Hesam
collection PubMed
description Near field scanning optical microscopy exploiting differential interference contrast enhancement is demonstrated. Beam splitting in the near field region is implemented using a dual color probe based on plasmonic color sorter idea. This provides the ability to illuminate two neighboring points on the sample simultaneously. It is shown that by modulating the two wavelengths employed in exciting such a probe, phase difference information can be retrieved through measuring the near field photoinduced force at the difference of the two modulation frequencies. This difference in frequency is engineered to correspond to the first resonant frequency of the cantilever, resulting in improved SNR, and sensitivity. The effect of both topographical and material changes in the proposed near field differential interference (NFDIC) technique are investigated for CNT and silica samples. This method is a promising technique for high contrast and high spatial resolution microscopy.
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spelling pubmed-72957752020-06-17 Near Field Differential Interference Contrast Microscopy Heydarian, Hesam Yazdanfar, Payam Zarif, Arezoo Rashidian, Bizhan Sci Rep Article Near field scanning optical microscopy exploiting differential interference contrast enhancement is demonstrated. Beam splitting in the near field region is implemented using a dual color probe based on plasmonic color sorter idea. This provides the ability to illuminate two neighboring points on the sample simultaneously. It is shown that by modulating the two wavelengths employed in exciting such a probe, phase difference information can be retrieved through measuring the near field photoinduced force at the difference of the two modulation frequencies. This difference in frequency is engineered to correspond to the first resonant frequency of the cantilever, resulting in improved SNR, and sensitivity. The effect of both topographical and material changes in the proposed near field differential interference (NFDIC) technique are investigated for CNT and silica samples. This method is a promising technique for high contrast and high spatial resolution microscopy. Nature Publishing Group UK 2020-06-15 /pmc/articles/PMC7295775/ /pubmed/32541881 http://dx.doi.org/10.1038/s41598-020-66482-z Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Heydarian, Hesam
Yazdanfar, Payam
Zarif, Arezoo
Rashidian, Bizhan
Near Field Differential Interference Contrast Microscopy
title Near Field Differential Interference Contrast Microscopy
title_full Near Field Differential Interference Contrast Microscopy
title_fullStr Near Field Differential Interference Contrast Microscopy
title_full_unstemmed Near Field Differential Interference Contrast Microscopy
title_short Near Field Differential Interference Contrast Microscopy
title_sort near field differential interference contrast microscopy
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7295775/
https://www.ncbi.nlm.nih.gov/pubmed/32541881
http://dx.doi.org/10.1038/s41598-020-66482-z
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