Extracting viscoelastic material parameters using an atomic force microscope and static force spectroscopy

Atomic force microscopy (AFM) techniques have provided and continue to provide increasingly important insights into surface morphology, mechanics, and other critical material characteristics at the nanoscale. One attractive implementation involves extracting meaningful material properties, which dem...

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Detalles Bibliográficos
Autores principales: Parvini, Cameron H, Saadi, M A S R, Solares, Santiago D
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Beilstein-Institut 2020
Materias:
Full Research Paper
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7308608/
https://www.ncbi.nlm.nih.gov/pubmed/32596096
http://dx.doi.org/10.3762/bjnano.11.77

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7308608/
https://www.ncbi.nlm.nih.gov/pubmed/32596096
http://dx.doi.org/10.3762/bjnano.11.77

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