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Measurement of electrostatic tip–sample interactions by time-domain Kelvin probe force microscopy
Kelvin probe force microscopy is a scanning probe technique used to quantify the local electrostatic potential of a surface. In common implementations, the bias voltage between the tip and the sample is modulated. The resulting electrostatic force or force gradient is detected via lock-in techniques...
| Autores principales: | , , |
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| Formato: | Online Artículo Texto |
| Lenguaje: | English |
| Publicado: |
Beilstein-Institut
2020
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| Materias: | |
| Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7308609/ https://www.ncbi.nlm.nih.gov/pubmed/32596095 http://dx.doi.org/10.3762/bjnano.11.76 |