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Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations

During cyclic loading, localization of intragranular deformation due to crystallographic slip acts as a precursor for crack initiation, often at coherent twin boundaries. A suite of high-resolution synchrotron X-ray characterizations, coupled with a crystal plasticity simulation, was conducted on a...

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Autores principales: Gustafson, Sven, Ludwig, Wolfgang, Shade, Paul, Naragani, Diwakar, Pagan, Darren, Cook, Phil, Yildirim, Can, Detlefs, Carsten, Sangid, Michael D.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7314802/
https://www.ncbi.nlm.nih.gov/pubmed/32581264
http://dx.doi.org/10.1038/s41467-020-16894-2
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author Gustafson, Sven
Ludwig, Wolfgang
Shade, Paul
Naragani, Diwakar
Pagan, Darren
Cook, Phil
Yildirim, Can
Detlefs, Carsten
Sangid, Michael D.
author_facet Gustafson, Sven
Ludwig, Wolfgang
Shade, Paul
Naragani, Diwakar
Pagan, Darren
Cook, Phil
Yildirim, Can
Detlefs, Carsten
Sangid, Michael D.
author_sort Gustafson, Sven
collection PubMed
description During cyclic loading, localization of intragranular deformation due to crystallographic slip acts as a precursor for crack initiation, often at coherent twin boundaries. A suite of high-resolution synchrotron X-ray characterizations, coupled with a crystal plasticity simulation, was conducted on a polycrystalline nickel-based superalloy microstructure near a parent-twin boundary in order to understand the deformation localization behavior of this critical, 3D microstructural configuration. Dark-field X-ray microscopy was spatially linked to high energy X-ray diffraction microscopy and X-ray diffraction contrast tomography in order to quantify, with cutting-edge resolution, an intragranular misorientation and high elastic strain gradients near a twin boundary. These observations quantify the extreme sub-grain scale stress gradients present in polycrystalline microstructures, which often lead to fatigue failure.
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spelling pubmed-73148022020-06-26 Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations Gustafson, Sven Ludwig, Wolfgang Shade, Paul Naragani, Diwakar Pagan, Darren Cook, Phil Yildirim, Can Detlefs, Carsten Sangid, Michael D. Nat Commun Article During cyclic loading, localization of intragranular deformation due to crystallographic slip acts as a precursor for crack initiation, often at coherent twin boundaries. A suite of high-resolution synchrotron X-ray characterizations, coupled with a crystal plasticity simulation, was conducted on a polycrystalline nickel-based superalloy microstructure near a parent-twin boundary in order to understand the deformation localization behavior of this critical, 3D microstructural configuration. Dark-field X-ray microscopy was spatially linked to high energy X-ray diffraction microscopy and X-ray diffraction contrast tomography in order to quantify, with cutting-edge resolution, an intragranular misorientation and high elastic strain gradients near a twin boundary. These observations quantify the extreme sub-grain scale stress gradients present in polycrystalline microstructures, which often lead to fatigue failure. Nature Publishing Group UK 2020-06-24 /pmc/articles/PMC7314802/ /pubmed/32581264 http://dx.doi.org/10.1038/s41467-020-16894-2 Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Gustafson, Sven
Ludwig, Wolfgang
Shade, Paul
Naragani, Diwakar
Pagan, Darren
Cook, Phil
Yildirim, Can
Detlefs, Carsten
Sangid, Michael D.
Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations
title Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations
title_full Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations
title_fullStr Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations
title_full_unstemmed Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations
title_short Quantifying microscale drivers for fatigue failure via coupled synchrotron X-ray characterization and simulations
title_sort quantifying microscale drivers for fatigue failure via coupled synchrotron x-ray characterization and simulations
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7314802/
https://www.ncbi.nlm.nih.gov/pubmed/32581264
http://dx.doi.org/10.1038/s41467-020-16894-2
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