Micro‐Scale Device—An Alternative Route for Studying the Intrinsic Properties of Solid‐State Materials: The Case of Semiconducting TaGeIr

An efficient application of a material is only possible if we know its physical and chemical properties, which is frequently obstructed by the presence of micro‐ or macroscopic inclusions of secondary phases. While sometimes a sophisticated synthesis route can address this issue, often obtaining pur...

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Detalles Bibliográficos
Autores principales: Antonyshyn, I., Wagner, F. R., Bobnar, M., Sichevych, O., Burkhardt, U., Schmidt, M., König, M., Poeppelmeier, K., Mackenzie, A. P., Svanidze, E., Grin, Yu.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: John Wiley and Sons Inc. 2020
Materias:
Research Articles
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7318276/
https://www.ncbi.nlm.nih.gov/pubmed/32202036
http://dx.doi.org/10.1002/anie.202002693

Internet

https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7318276/
https://www.ncbi.nlm.nih.gov/pubmed/32202036
http://dx.doi.org/10.1002/anie.202002693

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