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Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes

While intensive efforts have been devoted to studying the nature of the solid-electrolyte interphase (SEI), little attention has been paid to understanding its role in the mechanical failures of electrodes. Here we unveil the impact of SEI inhomogeneities on early-stage defect formation in Si electr...

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Autores principales: Chen, Chunguang, Zhou, Tao, Danilov, Dmitri L., Gao, Lu, Benning, Svenja, Schön, Nino, Tardif, Samuel, Simons, Hugh, Hausen, Florian, Schülli, Tobias U., Eichel, R.-A., Notten, Peter H. L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7329811/
https://www.ncbi.nlm.nih.gov/pubmed/32612261
http://dx.doi.org/10.1038/s41467-020-17104-9
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author Chen, Chunguang
Zhou, Tao
Danilov, Dmitri L.
Gao, Lu
Benning, Svenja
Schön, Nino
Tardif, Samuel
Simons, Hugh
Hausen, Florian
Schülli, Tobias U.
Eichel, R.-A.
Notten, Peter H. L.
author_facet Chen, Chunguang
Zhou, Tao
Danilov, Dmitri L.
Gao, Lu
Benning, Svenja
Schön, Nino
Tardif, Samuel
Simons, Hugh
Hausen, Florian
Schülli, Tobias U.
Eichel, R.-A.
Notten, Peter H. L.
author_sort Chen, Chunguang
collection PubMed
description While intensive efforts have been devoted to studying the nature of the solid-electrolyte interphase (SEI), little attention has been paid to understanding its role in the mechanical failures of electrodes. Here we unveil the impact of SEI inhomogeneities on early-stage defect formation in Si electrodes. Buried under the SEI, these early-stage defects are inaccessible by most surface-probing techniques. With operando full field diffraction X-ray microscopy, we observe the formation of these defects in real time and connect their origin to a heterogeneous degree of lithiation. This heterogeneous lithiation is further correlated to inhomogeneities in topography and lithium-ion mobility in both the inner- and outer-SEI, thanks to a combination of operando atomic force microscopy, electrochemical strain microscopy and sputter-etched X-ray photoelectron spectroscopy. Our multi-modal study bridges observations across the multi-level interfaces (Si/Li(x)Si/inner-SEI/outer-SEI), thus offering novel insights into the impact of SEI homogeneities on the structural stability of Si-based lithium-ion batteries.
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spelling pubmed-73298112020-07-06 Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes Chen, Chunguang Zhou, Tao Danilov, Dmitri L. Gao, Lu Benning, Svenja Schön, Nino Tardif, Samuel Simons, Hugh Hausen, Florian Schülli, Tobias U. Eichel, R.-A. Notten, Peter H. L. Nat Commun Article While intensive efforts have been devoted to studying the nature of the solid-electrolyte interphase (SEI), little attention has been paid to understanding its role in the mechanical failures of electrodes. Here we unveil the impact of SEI inhomogeneities on early-stage defect formation in Si electrodes. Buried under the SEI, these early-stage defects are inaccessible by most surface-probing techniques. With operando full field diffraction X-ray microscopy, we observe the formation of these defects in real time and connect their origin to a heterogeneous degree of lithiation. This heterogeneous lithiation is further correlated to inhomogeneities in topography and lithium-ion mobility in both the inner- and outer-SEI, thanks to a combination of operando atomic force microscopy, electrochemical strain microscopy and sputter-etched X-ray photoelectron spectroscopy. Our multi-modal study bridges observations across the multi-level interfaces (Si/Li(x)Si/inner-SEI/outer-SEI), thus offering novel insights into the impact of SEI homogeneities on the structural stability of Si-based lithium-ion batteries. Nature Publishing Group UK 2020-07-01 /pmc/articles/PMC7329811/ /pubmed/32612261 http://dx.doi.org/10.1038/s41467-020-17104-9 Text en © The Author(s) 2020 Open Access This article is licensed under a Creative Commons Attribution 4.0 International License, which permits use, sharing, adaptation, distribution and reproduction in any medium or format, as long as you give appropriate credit to the original author(s) and the source, provide a link to the Creative Commons license, and indicate if changes were made. The images or other third party material in this article are included in the article’s Creative Commons license, unless indicated otherwise in a credit line to the material. If material is not included in the article’s Creative Commons license and your intended use is not permitted by statutory regulation or exceeds the permitted use, you will need to obtain permission directly from the copyright holder. To view a copy of this license, visit http://creativecommons.org/licenses/by/4.0/.
spellingShingle Article
Chen, Chunguang
Zhou, Tao
Danilov, Dmitri L.
Gao, Lu
Benning, Svenja
Schön, Nino
Tardif, Samuel
Simons, Hugh
Hausen, Florian
Schülli, Tobias U.
Eichel, R.-A.
Notten, Peter H. L.
Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
title Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
title_full Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
title_fullStr Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
title_full_unstemmed Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
title_short Impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in Si electrodes
title_sort impact of dual-layer solid-electrolyte interphase inhomogeneities on early-stage defect formation in si electrodes
topic Article
url https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7329811/
https://www.ncbi.nlm.nih.gov/pubmed/32612261
http://dx.doi.org/10.1038/s41467-020-17104-9
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