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Sapphire Wafer for 226 nm Far UVC Generation with Carbon Nanotube-Based Cold Cathode Electron Beam (C-Beam) Irradiation
[Image: see text] Far ultraviolet C (UVC) light sources have the potential for numerous applications ranging from sterilization, purification, sensing, deodorization, surface modification, and so on. In particular, a short wavelength of far UVC is effective at sterilizing viruses and bacteria by min...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
American Chemical Society
2020
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Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7331211/ https://www.ncbi.nlm.nih.gov/pubmed/32637836 http://dx.doi.org/10.1021/acsomega.0c01824 |
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author | Yoo, Sung Tae Park, Kyu Chang |
author_facet | Yoo, Sung Tae Park, Kyu Chang |
author_sort | Yoo, Sung Tae |
collection | PubMed |
description | [Image: see text] Far ultraviolet C (UVC) light sources have the potential for numerous applications ranging from sterilization, purification, sensing, deodorization, surface modification, and so on. In particular, a short wavelength of far UVC is effective at sterilizing viruses and bacteria by minimizing damage to mammalian skin. Recently, many researchers are devoting materials and alternative light sources to overcome low efficiency, small light-emitting area, UV absorption, and complicated manufacturing processes of far UVC generation. Here, the sapphire wafer is evaluated for far UVC light generation using electron beam irradiation with carbon nanotube (CNT) emitters. A CNT-based cold cathode electron beam (C-beam) that emits electrons and accelerated onto κ-Al(2)O(3) of the sapphire wafer was used as an excitation source to demonstrate high-power far UVC light generation. High-efficiency 226 nm far UVC is made with a power conversion efficiency of 0.87% and a light-emitting area of 960 mm(2). Far UVC generation depends on the input power and the crystallinity of sapphire wafers. |
format | Online Article Text |
id | pubmed-7331211 |
institution | National Center for Biotechnology Information |
language | English |
publishDate | 2020 |
publisher | American Chemical Society |
record_format | MEDLINE/PubMed |
spelling | pubmed-73312112020-07-06 Sapphire Wafer for 226 nm Far UVC Generation with Carbon Nanotube-Based Cold Cathode Electron Beam (C-Beam) Irradiation Yoo, Sung Tae Park, Kyu Chang ACS Omega [Image: see text] Far ultraviolet C (UVC) light sources have the potential for numerous applications ranging from sterilization, purification, sensing, deodorization, surface modification, and so on. In particular, a short wavelength of far UVC is effective at sterilizing viruses and bacteria by minimizing damage to mammalian skin. Recently, many researchers are devoting materials and alternative light sources to overcome low efficiency, small light-emitting area, UV absorption, and complicated manufacturing processes of far UVC generation. Here, the sapphire wafer is evaluated for far UVC light generation using electron beam irradiation with carbon nanotube (CNT) emitters. A CNT-based cold cathode electron beam (C-beam) that emits electrons and accelerated onto κ-Al(2)O(3) of the sapphire wafer was used as an excitation source to demonstrate high-power far UVC light generation. High-efficiency 226 nm far UVC is made with a power conversion efficiency of 0.87% and a light-emitting area of 960 mm(2). Far UVC generation depends on the input power and the crystallinity of sapphire wafers. American Chemical Society 2020-06-15 /pmc/articles/PMC7331211/ /pubmed/32637836 http://dx.doi.org/10.1021/acsomega.0c01824 Text en Copyright © 2020 American Chemical Society This is an open access article published under an ACS AuthorChoice License (http://pubs.acs.org/page/policy/authorchoice_termsofuse.html) , which permits copying and redistribution of the article or any adaptations for non-commercial purposes. |
spellingShingle | Yoo, Sung Tae Park, Kyu Chang Sapphire Wafer for 226 nm Far UVC Generation with Carbon Nanotube-Based Cold Cathode Electron Beam (C-Beam) Irradiation |
title | Sapphire Wafer for 226 nm Far UVC Generation with
Carbon Nanotube-Based Cold Cathode Electron Beam (C-Beam) Irradiation |
title_full | Sapphire Wafer for 226 nm Far UVC Generation with
Carbon Nanotube-Based Cold Cathode Electron Beam (C-Beam) Irradiation |
title_fullStr | Sapphire Wafer for 226 nm Far UVC Generation with
Carbon Nanotube-Based Cold Cathode Electron Beam (C-Beam) Irradiation |
title_full_unstemmed | Sapphire Wafer for 226 nm Far UVC Generation with
Carbon Nanotube-Based Cold Cathode Electron Beam (C-Beam) Irradiation |
title_short | Sapphire Wafer for 226 nm Far UVC Generation with
Carbon Nanotube-Based Cold Cathode Electron Beam (C-Beam) Irradiation |
title_sort | sapphire wafer for 226 nm far uvc generation with
carbon nanotube-based cold cathode electron beam (c-beam) irradiation |
url | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7331211/ https://www.ncbi.nlm.nih.gov/pubmed/32637836 http://dx.doi.org/10.1021/acsomega.0c01824 |
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