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A Novel Microstructural Evolution Model for Growth of Ultra-Fine Al(2)O(3) Oxides from SiO(2) Silica Ceramic Decomposition during Self-Propagated High-Temperature Synthesis

In this paper, experimental verification of the microstructural evolution model during sintering of aluminum, iron and particulate mullite ceramic powders using self-propagated high-temperature synthesis (SHS) was performed. The powder mixture with 20% wt. content of reinforcing ceramic was investig...

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Detalles Bibliográficos
Autores principales: Kopec, Mateusz, Jóźwiak, Stanisław, Kowalewski, Zbigniew L.
Formato: Online Artículo Texto
Lenguaje:English
Publicado: MDPI 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7345891/
https://www.ncbi.nlm.nih.gov/pubmed/32585925
http://dx.doi.org/10.3390/ma13122821
Descripción
Sumario:In this paper, experimental verification of the microstructural evolution model during sintering of aluminum, iron and particulate mullite ceramic powders using self-propagated high-temperature synthesis (SHS) was performed. The powder mixture with 20% wt. content of reinforcing ceramic was investigated throughout this research. The mixed powders were cold pressed and sintered in a vacuum at 1030 °C. The SHS reaction between sintered feed powders resulted in a rapid temperature increase from the heat generated. The temperature increase led to the melting of an aluminum-based metallic liquid. The metallic liquid infiltrated the porous SiO(2) ceramics. Silicon atoms were transited into the intermetallic iron–aluminum matrix. Subsequently, a ternary matrix from the Fe–Al–Si system was formed, and synthesis of the oxygen and aluminum occurred. Synthesis of both these elements resulted in formation of new, fine Al(2)O(3) precipitates in the volume of matrix. The proposed microstructural evolution model for growth of ultra-fine Al(2)O(3) oxides from SiO(2) silica ceramic decomposition during SHS was successfully verified through scanning electron microscopy (SEM), X-ray energy-dispersive spectroscopy (EDS) analysis and X-ray diffraction (XRD).