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Novel theoretical approach to the GISAXS issue: the Green function formalism using the q-Eigenwaves propagating through a twofold rough-surfaced medium
To describe the 1D and 2D patterns of the grazing-incidence small-angle X-ray scattering (GISAXS) from a rough fractal surface, the novel integral equations for the amplitudes of reflected and transmitted waves are derived. To be specific, the analytical expression for the 2D total intensity distrib...
Autores principales: | , |
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Formato: | Online Artículo Texto |
Lenguaje: | English |
Publicado: |
Nature Publishing Group UK
2020
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Materias: | |
Acceso en línea: | https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7360765/ https://www.ncbi.nlm.nih.gov/pubmed/32665646 http://dx.doi.org/10.1038/s41598-020-68326-2 |
Sumario: | To describe the 1D and 2D patterns of the grazing-incidence small-angle X-ray scattering (GISAXS) from a rough fractal surface, the novel integral equations for the amplitudes of reflected and transmitted waves are derived. To be specific, the analytical expression for the 2D total intensity distribution [Formula: see text] is obtained. The latter represents by itself a superposition of terms related to the GISAXS specular [Formula: see text] and diffuse [Formula: see text] patterns, respectively. Hereafter, [Formula: see text] is the scattering meridian angle, [Formula: see text] is the scattering azimuth angle; [Formula: see text] is the angle of incidence. By using the above analytical expressions, the 1D and 2D GISAXS patterns are numerically calculated. Some new experimental measurements of the specular reflectivity curves R(spec)([Formula: see text] ) related to the fused quartz and crystal Si(111) samples have been carried out. Based on the theoretical approach developed, a direct least-squared procedure in a χ(2)-fit fashion has been used to determine the corresponding values of the root-mean-square roughness σ from the specular GISAXS reflectivity data. |
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