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Fast growth of large-grain and continuous MoS(2) films through a self-capping vapor-liquid-solid method

Most chemical vapor deposition methods for transition metal dichalcogenides use an extremely small amount of precursor to render large single-crystal flakes, which usually causes low coverage of the materials on the substrate. In this study, a self-capping vapor-liquid-solid reaction is proposed to...

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Detalles Bibliográficos
Autores principales: Chang, Ming-Chiang, Ho, Po-Hsun, Tseng, Mao-Feng, Lin, Fang-Yuan, Hou, Cheng-Hung, Lin, I-Kuan, Wang, Hsin, Huang, Pin-Pin, Chiang, Chun-Hao, Yang, Yueh-Chiang, Wang, I-Ta, Du, He-Yun, Wen, Cheng-Yen, Shyue, Jing-Jong, Chen, Chun-Wei, Chen, Kuei-Hsien, Chiu, Po-Wen, Chen, Li-Chyong
Formato: Online Artículo Texto
Lenguaje:English
Publicado: Nature Publishing Group UK 2020
Materias:
Acceso en línea:https://www.ncbi.nlm.nih.gov/pmc/articles/PMC7378841/
https://www.ncbi.nlm.nih.gov/pubmed/32703950
http://dx.doi.org/10.1038/s41467-020-17517-6
Descripción
Sumario:Most chemical vapor deposition methods for transition metal dichalcogenides use an extremely small amount of precursor to render large single-crystal flakes, which usually causes low coverage of the materials on the substrate. In this study, a self-capping vapor-liquid-solid reaction is proposed to fabricate large-grain, continuous MoS(2) films. An intermediate liquid phase-Na(2)Mo(2)O(7) is formed through a eutectic reaction of MoO(3) and NaF, followed by being sulfurized into MoS(2). The as-formed MoS(2) seeds function as a capping layer that reduces the nucleation density and promotes lateral growth. By tuning the driving force of the reaction, large mono/bilayer (1.1 mm/200 μm) flakes or full-coverage films (with a record-high average grain size of 450 μm) can be grown on centimeter-scale substrates. The field-effect transistors fabricated from the full-coverage films show high mobility (33 and 49 cm(2) V(−1) s(−1) for the mono and bilayer regions) and on/off ratio (1 ~ 5 × 10(8)) across a 1.5 cm × 1.5 cm region.